Publications

Generation of Test Patterns for Differential Diagnosis of Digital Circuits

AuthID
P-00K-5FB

Author(s)

Azevedo, F

Barahona, P

Editor(s)

Puget,J;Maher,M

Document Type

Proceedings Paper

Year published

1998

Published

in Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), ISSN: 0302-9743

Volume: 1520, Pages: 462

Conference

4Th International Conference on Principles and Practice of Constraint Programming, Cp 1998, Date: 26 October 1998 through 30 October 1998, Sponsors: AI IA;APT Pisa;Compulog Net;Cosytec;et al.;ILOG

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