Luis Miguel Nunes Pereira


AuthID: R-000-9RT

Confirmed Publications: 149



61
TITLE: 3 dimensional polymorphous silicon based metal-insulator-semiconductor position sensitive detectors  Full Text
AUTHORS: Aguas, H ; Pereira, S; Costa, D; Barquinha, P ; Pereira, L ; Fortunato, E ; Martins, R ;
PUBLISHED: 2007, SOURCE: 5th Symposium on Thin Films for Large Area Electronics held at the EMRS 2006 Spring Meeting in THIN SOLID FILMS, VOLUME: 515, ISSUE: 19
INDEXED IN: Scopus WOS
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62
TITLE: Advanced materials for the next generation of thin film transistors
AUTHORS: Elvira Fortunato ; Pedro Barquinha ; Luis Pereira ; Gongalo Goncalves; Rodrigo Martins ;
PUBLISHED: 2007, SOURCE: 7th International Display Manufacturing Conference (IDMC 07) in IDMC'07: PROCEEDINGS OF THE INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE 2007
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63
TITLE: Amorphous IZO TTFTs with saturation mobilities exceeding 100 cm(2)/Vs  Full Text
AUTHORS: Fortunato, E ; Barquinha, P ; Pimentel, A ; Pereira, L ; Goncalves, G; Martins, R ;
PUBLISHED: 2007, SOURCE: PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, VOLUME: 1, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
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64
TITLE: Characterization of nickel induced crystallized silicon by spectroscopic ellipsornetry
AUTHORS: Luis Pereira ; Hugo Aguas ; Manfred Beckers; Rui M S Martins ; Elvira Fortunato ; Rodrigo Martins ;
PUBLISHED: 2007, SOURCE: Symposium on Amorphous and Polycrystalline Thin-Film Silicon Science and Technology held at the 2006 MRS Spring Meeting in AMORPHOUS AND POLYCRYSTALLINE THIN-FILM SILICON SCIENCE AND TECHNOLOGY 2006, VOLUME: 910
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65
TITLE: Corrigendum to "Nickel assisted metal induced crystallization of silicon: Effect of native silicon oxide layer"  Full Text
AUTHORS: Pereira, L ; Martins, RMS ; Schell, N; Fortunato, E ; Martins, R ;
PUBLISHED: 2007, SOURCE: THIN SOLID FILMS, VOLUME: 516, ISSUE: 1
INDEXED IN: Scopus WOS
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66
TITLE: Effect of annealing temperature on the properties of IZO films and IZO based transparent TFTs  Full Text
AUTHORS: Barquinha, P ; Goncalves, G; Pereira, L ; Martins, R ; Fortunato, E ;
PUBLISHED: 2007, SOURCE: 1st International Symposium on Transparent Conducting Oxides in THIN SOLID FILMS, VOLUME: 515, ISSUE: 24
INDEXED IN: Scopus WOS CrossRef
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67
TITLE: In-situ study of Ni-Ti thin film growth on a TiN intermediate layer by X-ray diffraction  Full Text
AUTHORS: Martins, RMS ; Schell, N; Silva, RJC ; Pereira, L ; Mahesh, KK; Braz Fernandes, FMB ;
PUBLISHED: 2007, SOURCE: Symposium on Functional Materials for Micro and Nanosystems in SENSORS AND ACTUATORS B-CHEMICAL, VOLUME: 126, ISSUE: 1
INDEXED IN: Scopus WOS
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68
TITLE: Influence of post-annealing temperature on the properties exhibited by ITO, IZO and GZO thin films  Full Text
AUTHORS: Goncalves, G; Elangovan, E; Barquinha, P ; Pereira, L ; Martins, R ; Fortunato, E ;
PUBLISHED: 2007, SOURCE: 1st International Symposium on Transparent Conducting Oxides in THIN SOLID FILMS, VOLUME: 515, ISSUE: 24
INDEXED IN: Scopus WOS
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69
TITLE: Role of order and disorder in covalent semiconductors and ionic oxides used to produce thin film transistors  Full Text
AUTHORS: Martins, R ; Barquinha, P ; Pereira, L ; Ferreira, I ; Fortunato, E ;
PUBLISHED: 2007, SOURCE: APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, VOLUME: 89, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
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70
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