Manuel Armando Oliveira Pereira dos Santos


AuthID: R-000-A1H

Confirmed Publications: 33



21
TITLE: Characterization of RuO2 films prepared by rf reactive magnetron sputtering  Full Text
AUTHORS: Meng, LJ ; dos Santos, MP ;
PUBLISHED: 1999, SOURCE: APPLIED SURFACE SCIENCE, VOLUME: 147, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
22
TITLE: Characterization of RuO2 films prepared by RF reactive magnetron sputtering
AUTHORS: Meng, LJ ; dos Santos, MP ;
PUBLISHED: 1999, SOURCE: Symposium on Ferroelectric Thin Films VII in FERROELECTRIC THIN FILMS VII, VOLUME: 541
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
23
TITLE: Deposition of PZT thin film and determination of their optical properties  Full Text
AUTHORS: Czekaj, D; Gomes, MJM ; Vasilevskiy, M ; Pereira, M ; Dos Santos, MP ;
PUBLISHED: 1999, SOURCE: ELECTROCERAMICS VI 98 in JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, VOLUME: 19, ISSUE: 6-7
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
24
TITLE: Structural, chemical and optical characterisation of Ge-doped SiO2 glass films grown by magnetron rf-sputtering  Full Text
AUTHORS: Rolo, AG ; Conde, O ; Gomes, MJM ; dos Santos, MP ;
PUBLISHED: 1999, SOURCE: Proceedings of the 1997 Advances in Materials and Processing Technologies, AMPT'97 in JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, VOLUME: 93
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
25
TITLE: Effect of substrate temperature on the properties of RuO2 films prepared by RF reactive magnetron sputtering
AUTHORS: Meng, LJ ; Fortunato, E ; Nunos, R; dos Santos, MP ;
PUBLISHED: 1998, SOURCE: 9th International Meeting on Ferroelectricity (IMF-9) in JOURNAL OF THE KOREAN PHYSICAL SOCIETY, VOLUME: 32, ISSUE: 4 SUPPL.
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
26
TITLE: Growth and characterisation of cadmium sulphide nanocrystals embedded in silicon dioxide films  Full Text
AUTHORS: Rolo, AG ; Vieira, LG ; Gomes, MJM ; Ribeiro, JL; Belsley, MS ; dos Santos, MP ;
PUBLISHED: 1998, SOURCE: THIN SOLID FILMS, VOLUME: 312, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef Handle
IN MY: ORCID
27
28
TITLE: Stress analysis of titanium dioxide films by Raman scattering and X-ray diffraction methods
AUTHORS: Meng, LJ; dosSantos, MP ;
PUBLISHED: 1997, SOURCE: Symposium on Thin Films - Stresses and Mechanical Properties VI, at the 1996 MRS Spring Meeting in THIN FILMS: STRESSES AND MECHANICAL PROPERTIES VI, VOLUME: 436
INDEXED IN: WOS CrossRef: 2
IN MY: ORCID
29
30
TITLE: INTERFEROMETRIC DETECTION OF CROSS-PHASE MODULATION IN CDS  Full Text
AUTHORS: HIRLIMANN, C; WASSMUTH, E; KLING, E; PETIT, S; DOSSANTOS, MP ;
PUBLISHED: 1994, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 65, ISSUE: 8
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
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