201
TITLE: Ion nitriding of Al: growth kinetics and characterisation of the nitride layer  Full Text
AUTHORS: Telbizova, T; Parascandola, S; Prokert, F; Barradas, NP ; Richter, E; Moller, W;
PUBLISHED: 2001, SOURCE: 7th International Conference on Plasma Surface Engineering (PSE 2000) in SURFACE & COATINGS TECHNOLOGY, VOLUME: 142
INDEXED IN: Scopus WOS CrossRef
202
TITLE: Monte Carlo calculations for neutron and gamma radiation fields on a fast neutron irradiation device
AUTHORS: Vieira, A; Ramalho, A; Goncalves, IC; Fernandes, A; Barradas, N ; Marques, JG; Prata, J; Chaussy, C;
PUBLISHED: 2001, SOURCE: International Conference on Advanced Monte Carlo for Radiation Physics, Particle Transport Simulation and Applications in ADVANCED MONTE CARLO FOR RADIATION PHYSICS, PARTICLE TRANSPORT SIMULATION AND APPLICATIONS
INDEXED IN: WOS
203
TITLE: Radiation tests on commercial instrumentation amplifiers, analog switches & DAC's
AUTHORS: Agapito, JA; Barradas, NP ; Cardeira, FM; Casas, J; Fernandes, AP; Franco, FJ; Gomes, P; Goncalves, IC; Cachero, AH; Lozano, J; Marques, JG; Paz, A; Prata, MJ; Ramalho, AJG; Ruiz, MAR; Santos, JP; Vieira, A;
PUBLISHED: 2001, SOURCE: 7th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE SEVENTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS, VOLUME: 2001, ISSUE: 5
INDEXED IN: WOS
204
TITLE: RBS analysis of MBE grown SiGe/(001)Si heterostructures with thin high Ge content SiGe channels for HMOS transistors  Full Text
AUTHORS: Barradas, NP ; Sequeira, AD; Franco, N; Myronov, M; Mironov, OA; Phillips, PJ; Parker, EHC;
PUBLISHED: 2001, SOURCE: Workshop on Advanced Materials Produced and Analyzed with Ion Beams in MODERN PHYSICS LETTERS B, VOLUME: 15, ISSUE: 28-29
INDEXED IN: Scopus WOS
205
TITLE: Resistance decrease in spin tunnel junctions by control of natural oxidation conditions  Full Text
AUTHORS: Zhang, ZG; Freitas, PP ; Ramos, AR ; Barradas, NP ; Soares, JC ;
PUBLISHED: 2001, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 79, ISSUE: 14
INDEXED IN: Scopus WOS CrossRef
206
TITLE: Rutherford backscattering analysis of thin films and superlattices with roughness
AUTHORS: Barradas, NP ;
PUBLISHED: 2001, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 34, ISSUE: 14
INDEXED IN: Scopus WOS CrossRef
207
TITLE: Rutherford backscattering spectrometry and computer simulation for the in-depth analysis of chemically modified poly(vinylidene fluoride)  Full Text
AUTHORS: Ross, GJ; Barradas, NP ; Hill, MP; Jeynes, C; Morrissey, P; Watts, JF;
PUBLISHED: 2001, SOURCE: JOURNAL OF MATERIALS SCIENCE, VOLUME: 36, ISSUE: 19
INDEXED IN: Scopus WOS CrossRef: 5
208
TITLE: Tunnel junctions with AlN barriers and FeTaN electrodes  Full Text
AUTHORS: Wang, JG; Cardoso, S ; Freitas, PP ; Wei, P; Barradas, NP ; Soares, JC ;
PUBLISHED: 2001, SOURCE: 8th Joint MMM/Intermag Conference in JOURNAL OF APPLIED PHYSICS, VOLUME: 89, ISSUE: 11
INDEXED IN: Scopus WOS CrossRef
209
TITLE: Accurate depth profiling of complex optical coatings  Full Text
AUTHORS: Jeynes, C; Barradas, NP ; Rafla Yuan, H; Hichwa, BP; Close, R;
PUBLISHED: 2000, SOURCE: 8th European Conference on Applications of Surface and Interface Analysis in SURFACE AND INTERFACE ANALYSIS, VOLUME: 30, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
210
TITLE: Artificial neural network algorithm for analysis of Rutherford backscattering data
AUTHORS: Barradas, NP ; Vieira, A;
PUBLISHED: 2000, SOURCE: PHYSICAL REVIEW E, VOLUME: 62, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
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