41
TITLE: Neutron spectrometry with large volume, heavy-loaded superheated droplet detectors: A simple spin-off
AUTHORS: Ramos, AR ; Giuliani, F; Felizardo, M ; Girard, TA ; Morlat, T; Marques, JG ; Oliveira, C; Limagne, D; Waysand, G; Fernandes, AC;
PUBLISHED: 2005, SOURCE: 10th International Conference on Radiation Shielding (ICRS-10)/13th ANS Topical Meeting on Radiation Protection and Shielding (RPS 2004) in RADIATION PROTECTION DOSIMETRY, VOLUME: 115, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef: 4
42
TITLE: Recent results from the simple dark matter search
AUTHORS: Girard, T; Giuliani, F; Collar, JI; Morlat, T; Limagne, D; Waysand, G; Auguste, M; Boyer, D; Cavaillou, A; Miley, HS; Da Costa, M ; Martins, RC; Marques, JG; Ramos, AR ; Fernandes, AC; Puibasset, J; Oliveira, C;
PUBLISHED: 2005, SOURCE: 5th International Workshop on the Identification of Dark Matter in Identification of Dark Matter
INDEXED IN: WOS CrossRef
43
TITLE: Signal discrimination in superheated droplet detectors
AUTHORS: Felizardo, M ; Martins, RC ; Ramos, AR ; Morlat, T; Giuliani, F; Marques, JG ; Limagne, D; Waysand, G; Fernandes, AC ; Girard, TA ; Alegria, F;
PUBLISHED: 2005, SOURCE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
INDEXED IN: Scopus
44
TITLE: SIMPLE dark matter search results  Full Text
AUTHORS: Girard, TA ; Giuliani, F; Morlat, T; da Costa, MF ; Collar, JI; Limagne, C; Waysand, G; Puibasset, J; Miley, HS; Auguste, M; Boyer, D; Cavaillou, A; Marques, JG ; Oliveira, C; Fernandes, AC; Ramos, AR ; Martins, RC ;
PUBLISHED: 2005, SOURCE: PHYSICS LETTERS B, VOLUME: 621, ISSUE: 3-4
INDEXED IN: Scopus WOS CrossRef: 48
45
TITLE: Stability of erbium and silver implanted in silica-titania sol-gel films  Full Text
AUTHORS: Ramos, AR ; Marques, C; Alves, E ; Marques, AC ; Almeida, RM ;
PUBLISHED: 2005, SOURCE: 8th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 240, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
46
TITLE: Compositional profiles in silica-based sol-gel films doped with erbium and silver, by RBS and ERDA  Full Text
AUTHORS: Marques, AC ; Almeida, RM ; Ramos, AR ; Alves, E ;
PUBLISHED: 2004, SOURCE: 12th International Workshop on Sol-Gel-Science and Technology (Sol-Gel 2003) in JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, VOLUME: 31, ISSUE: 1-3
INDEXED IN: Scopus WOS CrossRef
47
TITLE: Effect of an interfacial oxide layer in the annealing behaviour of Au/a-Si : H MIS photodiodes  Full Text
AUTHORS: Aguas, H ; Pereira, L ; Ferreira, I ; Ramos, AR ; Viana, AS ; Andreu, J; Vilarinho, P ; Fortunato, E ; Martins, R ;
PUBLISHED: 2004, SOURCE: 20th International Conference on Amorphous and Microcrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 338, ISSUE: 1 SPEC. ISS.
INDEXED IN: Scopus WOS
48
TITLE: Effect of annealing on gold rectifying contacts in amorphous silicon
AUTHORS: Aguas, H ; Pereira, L ; Ferreira, I ; Ramos, AR ; Viana, AS ; Andreu, J; Vilarinho, P ; Fortunato, E ; Martins, R ;
PUBLISHED: 2004, SOURCE: 2nd International Materials Symposium in ADVANCED MATERIALS FORUM II, VOLUME: 455-456
INDEXED IN: Scopus WOS
49
TITLE: Effect of ion current density on damage in Al ion implanted SiC  Full Text
AUTHORS: Battistig, G; Lopez, JG; Morilla, Y; Khanh, NQ; Lohner, T; Petrik, P; Ramos, AR ;
PUBLISHED: 2004, SOURCE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
50
TITLE: Ion beam studies of TiNxOy thin films deposited by reactive magnetron sputtering  Full Text
AUTHORS: Alves, E ; Ramos, AR ; Barradas, NP ; Vaz, F ; Cerqueira, P; Rebouta, L ; Kreissig, U;
PUBLISHED: 2004, SOURCE: Symposium on Protective Coatings and Thin Films held at the E-MRS 20th Spring Meeting in SURFACE & COATINGS TECHNOLOGY, VOLUME: 180
INDEXED IN: Scopus WOS CrossRef
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