Anabela Gomes Rolo


AuthID: R-000-1KH

Confirmed Publications: 77



11
TITLE: Structural and electrical studies of ultrathin layers with Si0.7Ge0.3 nanocrystals confined in a SiGe/SiO2 superlattice
AUTHORS: Vieira, EMF; Martin Sanchez, J; Rolo, AG ; Parisini, A; Buljan, M; Capan, I; Alves, E ; Barradas, NP ; Conde, O ; Bernstorff, S; Chahboun, A ; Levichev, S ; Gomes, MJM ;
PUBLISHED: 2012, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 111, ISSUE: 10
INDEXED IN: Scopus WOS CrossRef Handle
IN MY: ORCID
12
TITLE: Influence of the deposition parameters on the growth of SiGe nanocrystals embedded in Al2O3 matrix
AUTHORS: Vieira, EMF; Pinto, SRC; Levichev, S ; Rolo, AG ; Chahboun, A ; Buljan, M; Barradas, NP ; Alves, E ; Bernstorff, S; Conde, O ; Gomes, MJM ;
PUBLISHED: 2011, SOURCE: EMRS 2010 Spring Meeting on Post-Si-CMOS Electronic Devices - The Role of Ge and III-V Materials in MICROELECTRONIC ENGINEERING, VOLUME: 88, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef Handle
IN MY: ORCID
13
TITLE: Low-temperature fabrication of layered self-organized Ge clusters by RF-sputtering
AUTHORS: Pinto, SRC; Rolo, AG ; Buljan, M; Chahboun, A ; Bernstorff, S; Barradas, NP ; Alves, E ; Kashtiban, RJ; Bangert, U; Gomes, MJM ;
PUBLISHED: 2011, SOURCE: NANOSCALE RESEARCH LETTERS, VOLUME: 6, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef Handle
IN MY: ORCID
14
TITLE: Resonant Raman scattering in ZnO:Mn and ZnO:Mn:Al thin films grown by RF sputtering  Full Text
AUTHORS: Cerqueira, MF ; Vasilevskiy, MI ; Oliveira, F; Rolo, AG ; Viseu, T ; de Campos, JA ; Alves, E ; Correia, R;
PUBLISHED: 2011, SOURCE: JOURNAL OF PHYSICS-CONDENSED MATTER, VOLUME: 23, ISSUE: 33
INDEXED IN: Scopus WOS CrossRef Handle
IN MY: ORCID
15
TITLE: Thermal co-evaporation of Sb2Te3 thin-films optimized for thermoelectric applications  Full Text
AUTHORS: Goncalves, LM ; Alpuim, P ; Rolo, AG ; Correia, JH ;
PUBLISHED: 2011, SOURCE: THIN SOLID FILMS, VOLUME: 519, ISSUE: 13
INDEXED IN: Scopus WOS CrossRef Handle
IN MY: ORCID
16
TITLE: alpha- and gamma-PVDF: Crystallization kinetics, microstructural variations and thermal behaviour  Full Text
AUTHORS: Silva, MP; Sencadas, V ; Botelho, G ; Machado, AV ; Rolo, AG ; Rocha, JG ; Lanceros Mendez, S ;
PUBLISHED: 2010, SOURCE: MATERIALS CHEMISTRY AND PHYSICS, VOLUME: 122, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef Handle
IN MY: ORCID
17
TITLE: Determination of residual stress in PZT films produced by laser ablation with X-ray diffraction and Raman spectroscopy  Full Text
AUTHORS: Rodrigues, SAS; Rolo, AG ; Khodorov, A ; Pereira, M ; Gomes, MJM ;
PUBLISHED: 2010, SOURCE: 11th Electroceramics Conference 2008 in JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, VOLUME: 30, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
18
TITLE: Electrical and Raman Scattering Studies of ZnO:P and ZnO:Sb Thin Films
AUTHORS: de Campos, JA; Viseu, T ; Rolo, AG ; Barradas, NP ; Alves, E ; de Lacerda Aroso, T ; Cerqueira, MF ;
PUBLISHED: 2010, SOURCE: 2nd International Conference on Advanced Nano Materials in JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, VOLUME: 10, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef Handle
IN MY: ORCID
19
TITLE: Formation of void lattice after annealing of Ge quantum dot lattice in alumina matrix  Full Text
AUTHORS: Pinto, SRC; Rolo, AG ; Gomes, MJM ; Ivanda, M; Bogdanovic Radovic, I; Grenzer, J; Muecklich, A; Barber, DJ; Bernstorff, S; Buljan, M;
PUBLISHED: 2010, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 97, ISSUE: 17
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
20
TITLE: Ge nanocrystals in alumina matrix: a structural study  Full Text
AUTHORS: Kashtiban, RJ; Pinto, SRC; Bangert, U; Rolo, AG ; Chahboun, A ; Gomes, MJM ; Harvey, AJ;
PUBLISHED: 2010, SOURCE: 16th International Conference on Microscopy of Semiconducting Materials in 16TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS, VOLUME: 209
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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