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Luis Alexandre Machado da Rocha
AuthID:
R-000-M11
Publications
Confirmed
To Validate
Document Source:
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Document Type:
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Proceedings Paper (49)
Article (19)
Review (2)
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Year Dsc
Year Asc
Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
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Results:
10
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Confirmed Publications: 70
61
TITLE:
Pull-in dynamics: Analysis and modeling of the transitional regime
AUTHORS:
Rocha, LA
;
Cretu, E
;
Wolffenbuttel, RF
;
PUBLISHED:
2004
,
SOURCE:
17th IEEE International Conference on Micro Electro Mechanical Systems (MEMS): Maastricht MEMS 2004 Technical Digest
in
Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
INDEXED IN:
Scopus
IN MY:
ORCID
62
TITLE:
Quadrature oscillator with pre-distorted waveforms for application in MEMS-based mechanical spectrum analyser
AUTHORS:
de Graaf, G; Mol, L;
Rocha, L
; Cretu, E; Wolffenbuttel, RF;
PUBLISHED:
2004
,
SOURCE:
30th European Solid-State Circuits Conference (ESSCIRC 2004)
in
ESSCIRC 2004: PROCEEDINGS OF THE 30TH EUROPEAN SOLID-STATE CIRCUITS CONFERENCE
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
63
TITLE:
Electro-mechanical feedback for realization of a mechanical spectrum analyzer
AUTHORS:
Cretu, E;
Rocha, LA
; Wolffenbuttel, RF;
PUBLISHED:
2003
,
SOURCE:
12th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS 03)
in
BOSTON TRANSDUCERS'03: DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2,
VOLUME:
2
INDEXED IN:
Scopus
WOS
CrossRef
:
1
IN MY:
ORCID
64
TITLE:
Mechanical spectrum analyzer in silicon using micromachined accelerometers with time-varying electrostatic feedback
AUTHORS:
Rocha, LA
;
Cretu, E
; De Graaf, G;
Wolffenbuttel, RF
;
PUBLISHED:
2003
,
SOURCE:
Proceedings of the 20th IEEE Information and Measurement Technology Conference
in
Conference Record - IEEE Instrumentation and Measurement Technology Conference,
VOLUME:
2
INDEXED IN:
Scopus
IN MY:
ORCID
65
TITLE:
Mechanical spectrum analyzer in silicon using micromachined accelerometers with time-varying electrostatic feedback
AUTHORS:
Rocha, LA
;
Cretu, E
; de Graaf, G;
Wolffenbuttel, RF
;
PUBLISHED:
2003
,
SOURCE:
20th IEEE Instrumentation and Measurement Technology Conference
in
IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
INDEXED IN:
WOS
IN MY:
ResearcherID
66
TITLE:
Performance of integrated silicon infrared microspectrometers
AUTHORS:
Kong, SH; De Graaf, G;
Rocha, LA
;
Wolffenbuttel, RF
;
PUBLISHED:
2003
,
SOURCE:
Proceedings of the 20th IEEE Information and Measurement Technology Conference
in
Conference Record - IEEE Instrumentation and Measurement Technology Conference,
VOLUME:
1
INDEXED IN:
Scopus
IN MY:
ORCID
67
TITLE:
Stability of silicon microfabricated pull-in voltage references
AUTHORS:
Rocha, LA
;
Wolffenbuttel, RF
;
PUBLISHED:
2002
,
SOURCE:
Conference on Precision Electromagnetic Measurements (CPEM 2002)
in
2002 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CONFERENCE DIGEST
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
68
TITLE:
The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references
AUTHORS:
Rocha, LA
;
Cretu, E
;
Wolffenbuttel, RF
;
PUBLISHED:
2002
,
SOURCE:
19th IEEE Instrumentation and Measurement Technology Conference
in
Conference Record - IEEE Instrumentation and Measurement Technology Conference,
VOLUME:
1
INDEXED IN:
Scopus
IN MY:
ORCID
69
TITLE:
The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references
AUTHORS:
Rocha, LA
;
Cretu, E
;
Wolffenbuttel, RF
;
PUBLISHED:
2002
,
SOURCE:
19th IEEE Instrumentation and Measurement Technology Conference (IMTC/2002)
in
IMTC 2002: PROCEEDINGS OF THE 19TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 & 2
INDEXED IN:
WOS
IN MY:
ResearcherID
70
TITLE:
Using the pull-in voltage as voltage reference
AUTHORS:
Cretu, E
;
Rocha, LA
;
Wolffenbuttel, RF
;
PUBLISHED:
2001
,
SOURCE:
11th International Conference on Solid-State Sensors and Actuators
in
TRANSDUCERS '01: EUROSENSORS XV, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2
INDEXED IN:
WOS
IN MY:
ResearcherID
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