António Manuel Cruz Serra


AuthID: R-000-28E

Confirmed Publications: 125



21
TITLE: A new sine-fitting algorithm for accurate amplitude and phase measurements in two channel acquisition systems  Full Text
AUTHORS: Pedro M Ramos ; Antonio Cruz Serra ;
PUBLISHED: 2008, SOURCE: 17th IMEKO Congress in MEASUREMENT, VOLUME: 41, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
22
TITLE: An efficient approach to detect and classify power quality disturbances
AUTHORS: Tomas Radil; Fernando M Janeiro ; Pedro M Ramos ; Cruz C Serra ;
PUBLISHED: 2008, SOURCE: COMPEL-THE INTERNATIONAL JOURNAL FOR COMPUTATION AND MATHEMATICS IN ELECTRICAL AND ELECTRONIC ENGINEERING, VOLUME: 27, ISSUE: 5
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
23
TITLE: Characterization of a new symmetrical cancelation method for Magnetic Induction Tomography
AUTHORS: Bras, NB; Martins, RC; Serra, AC ;
PUBLISHED: 2008, SOURCE: 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session in 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
INDEXED IN: Scopus
IN MY: ORCID
24
TITLE: Detection and classification of transients and waveform distortions using an algorithm based on sine-fitting
AUTHORS: Ramos, PM ; Radil, T; Serra, AC ;
PUBLISHED: 2008, SOURCE: 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session in 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
INDEXED IN: Scopus
IN MY: ORCID
25
TITLE: Detection and Extraction of Harmonic and Non-harmonic Power Quality Disturbances Using Sine Fitting Methods
AUTHORS: Tomas Radil; Pedro M Ramos ; Cruz C Serra ;
PUBLISHED: 2008, SOURCE: 13th International Conference on Harmonics and Quality of Power in 2008 13TH INTERNATIONAL CONFERENCE ON HARMONICS AND QUALITY OF POWER, VOLS 1 AND 2
INDEXED IN: WOS
26
TITLE: Detection and extraction of harmonic and non-harmonic power quality disturbances using sine fitting methods
AUTHORS: Radii, T; Ramos, PM ; Serra, AC ;
PUBLISHED: 2008, SOURCE: ICHQP 2008: 13th International Conference on Harmonics and Quality of Power in ICHQP 2008: 13th International Conference on Harmonics and Quality of Power
INDEXED IN: Scopus
IN MY: ORCID
27
TITLE: Dimensioning and Characterization of a New Magnetic Induction Tomography Experimental Setup  Full Text
AUTHORS: Nuno B Bras; Alexandre Pestana; Rafil C Martins ; Antnio C Serra ;
PUBLISHED: 2008, SOURCE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
28
TITLE: Extensible mark-up language file definition for structured acquisition data storage and transfer  Full Text
AUTHORS: Nuno B Bras; Pedro M Ramos ; Cruz C Serra ;
PUBLISHED: 2008, SOURCE: MEASUREMENT, VOLUME: 41, ISSUE: 3
INDEXED IN: Scopus WOS
29
TITLE: FOUR-PARAMETER SINE-FITTING ALGORITHM FOR DETECTION AND CLASSIFICATION OF TRANSIENTS AND WAVEFORM DISTORTIONS
AUTHORS: Pedro M Ramos ; Tomas Radil; Cruz C Serra ;
PUBLISHED: 2008, SOURCE: METROLOGY AND MEASUREMENT SYSTEMS, VOLUME: 15, ISSUE: 4
INDEXED IN: Scopus WOS
IN MY: ORCID
30
TITLE: Frequency Estimation of Power System Signals Using a New Spectrum Leakage Correction Algorithm  Full Text
AUTHORS: Tomas Radil; Pedro M Ramos ; Cruz C Serra ;
PUBLISHED: 2008, SOURCE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
Page 3 of 13. Total results: 125.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service