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Artur Fernando Delgado Lopes Ribeiro
AuthID:
R-000-2K6
Publications
Confirmed
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Document Type:
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Proceedings Paper (37)
Article (19)
Review (1)
Correction (1)
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Order:
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Cit. WOS Dsc
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Results:
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Confirmed Publications: 58
21
TITLE:
Measuring interface for an ECT system [Interfejs pomiarowy w systemie wykorzystuja{ogonek}cym pra{ogonek}dy wirowe]
AUTHORS:
Ramos, HG
;
Ribeiro, AL
;
Kubinyi, M
;
PUBLISHED:
2011
,
SOURCE:
Przeglad Elektrotechniczny,
VOLUME:
87,
ISSUE:
7
INDEXED IN:
Scopus
IN MY:
ORCID
22
TITLE:
Portable eddy current NDT instrument using two different implementations
AUTHORS:
Pasadas, D
;
Rocha, T
;
Ramos, H
;
Ribeiro, AL
;
PUBLISHED:
2011
,
SOURCE:
International Conference on Computer as a Tool, EUROCON 2011 - Joint with Conftele 2011
in
EUROCON 2011 - International Conference on Computer as a Tool - Joint with Conftele 2011
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
23
TITLE:
Thickness Measurement Using Transient Eddy Current Techniques
Full Text
AUTHORS:
Kral, J
; Smid, R;
Geirnhas Ramos, HMG
;
Lopes Ribeiro, AL
;
PUBLISHED:
2011
,
SOURCE:
IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
in
2011 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
24
TITLE:
A Fast Forward Problem Solver for the Reconstruction of Biological Maps in Magnetic Induction Tomography
AUTHORS:
Nuno B Bras
;
Raul C Martins
;
Serra, AC
;
Lopes Ribeiro, AL
;
PUBLISHED:
2010
,
SOURCE:
IEEE TRANSACTIONS ON MAGNETICS,
VOLUME:
46,
ISSUE:
5
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
25
TITLE:
Eddy Current Image Normalization in NDT of Aluminum Plates
Full Text
AUTHORS:
Luka Kufrin
;
Lopes Ribeiro, AL
;
Ramos, HG
;
PUBLISHED:
2010
,
SOURCE:
International Instrumentation and Measurement Technology Conference (I2MTC)
in
2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
26
TITLE:
Experiment and simulation of the eddy current NDT on an aluminium plate using a uniform field probe
AUTHORS:
Kufrin, L
;
Ribeiro, AL
;
Ramos, HG
;
Postolache, O
;
PUBLISHED:
2010
,
SOURCE:
17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
in
17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
INDEXED IN:
Scopus
IN MY:
ORCID
27
TITLE:
Image Analysis for Crack Detection
Full Text
AUTHORS:
Luka Kufrin
;
Postolache, O
;
Lopes L Ribeiro
;
Geirinhas M G Ramos
;
PUBLISHED:
2010
,
SOURCE:
International Instrumentation and Measurement Technology Conference (I2MTC)
in
2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS
INDEXED IN:
Scopus
WOS
CrossRef
:
3
IN MY:
ORCID
28
TITLE:
Induction defectoscope based on uniform eddy current probe with GMRs
Full Text
AUTHORS:
Octavian Postolache
;
Artur Lopes Ribeiro
;
Helena Geirinhas Ramos
;
PUBLISHED:
2010
,
SOURCE:
International Instrumentation and Measurement Technology Conference (I2MTC)
in
2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS
INDEXED IN:
Scopus
WOS
CrossRef
:
3
IN MY:
ORCID
29
TITLE:
Liftoff Correction Based on the Spatial Spectral Behavior of Eddy-Current Images
AUTHORS:
Lopes L Ribeiro
;
Francisco Alegria
;
Octavian A Postolache
;
Helena Maria G Geirinhas Ramos
;
PUBLISHED:
2010
,
SOURCE:
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
VOLUME:
59,
ISSUE:
5
INDEXED IN:
Scopus
WOS
CrossRef
:
20
IN MY:
ORCID
30
TITLE:
New architectures of uniform eddy current probes for NDT using GMR
AUTHORS:
Postolache, O
;
Ramos, HG
;
Ribeiro, AL
;
PUBLISHED:
2010
,
SOURCE:
17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
in
17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
INDEXED IN:
Scopus
IN MY:
ORCID
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