Eduardo Jorge da Costa Alves


AuthID: R-000-4EK

Confirmed Publications: 597



191
TITLE: Ion beam processing of sapphire single crystals  Full Text
AUTHORS: Alves, E ; Marques, C; da Silva, RC; Monteiro, T ; McHargue, C;
PUBLISHED: 2009, SOURCE: 15th International Conference on Surface Modification of Materials by Ion Beams in SURFACE & COATINGS TECHNOLOGY, VOLUME: 203, ISSUE: 17-18
INDEXED IN: Scopus WOS CrossRef: 5
IN MY: ORCID | ResearcherID
192
TITLE: Lattice location and annealing studies of Hf implanted CaF2  Full Text
AUTHORS: Thomas Geruschke; Katharina Lorenz ; Eduardo Alves ; Reiner Vianden;
PUBLISHED: 2009, SOURCE: 16th International Conference on Ion Beam Modification of Materials in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 267, ISSUE: 8-9
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
193
TITLE: Luminescence of Eu ions in AlxGa1-xN across the entire alloy composition range
AUTHORS: Wang, K; O'Donnell, KP; Hourahine, B; Martin, RW; Watson, IM; Lorenz, K ; Alves, E ;
PUBLISHED: 2009, SOURCE: PHYSICAL REVIEW B, VOLUME: 80, ISSUE: 12
INDEXED IN: Scopus WOS CrossRef
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194
TITLE: Microstructural evolution in tungsten and copper probes under hydrogen irradiation at ISTTOK  Full Text
AUTHORS: Nunes, D ; Mateus, R ; Nogueira, ID; Carvalho, PA ; Correia, JB; Shohoji, N; Gomes, RB ; Fernandes, H ; Silva, C ; Franco, N; Alves, E ;
PUBLISHED: 2009, SOURCE: 18th International Conference on Plasma-Surface Interactions in Controlled Fusion Devices in JOURNAL OF NUCLEAR MATERIALS, VOLUME: 390-91, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
195
TITLE: Microstructure Characterization of ODS-RAFM Steels
AUTHORS: Mateus, R ; Carvalho, PA ; Nunes, D ; Alves, LC ; Franco, N; Correia, JB; Fernandes, H; Silva, C ; Lindau, R; Alves, E ;
PUBLISHED: 2009, SOURCE: Symposium on Materials for Future Fusion and Fission Technologies held at the 2008 MRS Fall Meeting in MATERIALS FOR FUTURE FUSION AND FISSION TECHNOLOGIES, VOLUME: 1125
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
196
TITLE: Morphological and optical properties of silicon thin films by PLD  Full Text
AUTHORS: Ayouchi, R ; Schwarz, R ; Melo, LV ; Ramalho, R; Alves, E ; Marques, CP; Santos, L ; Almeida, R ; Conde, O ;
PUBLISHED: 2009, SOURCE: APPLIED SURFACE SCIENCE, VOLUME: 255, ISSUE: 10
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
197
TITLE: New Approaches to Thermoelectric Materials
AUTHORS: Goncalves, AP ; Lopes, EB ; Alves, E ; Barradas, NP ; Franco, N; Rouleau, O; Godart, C;
PUBLISHED: 2009, SOURCE: NATO Advanced Research Workshop on Properties and Applications of Thermoelectric Materials in PROPERTIES AND APPLICATIONS OF THERMOELECTRIC MATERIALS
INDEXED IN: WOS
IN MY: ORCID | ResearcherID
198
TITLE: New approaches to thermoelectric materials
AUTHORS: Goncalves, AP ; Lopes, EB ; Alves, E ; Barradas, NP ; Franco, N; Rouleau, O; Godart, C;
PUBLISHED: 2009, SOURCE: NATO Science for Peace and Security Series B: Physics and Biophysics
INDEXED IN: Scopus
199
TITLE: Optical and structural properties of Eu-implanted InxAl1-xN  Full Text
AUTHORS: Roqan, IS; O'Donnell, KP; Martin, RW; Trager Cowan, C; Matias, V; Vantomme, A; Lorenz, K ; Alves, E ; Watson, IM;
PUBLISHED: 2009, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 106, ISSUE: 8
INDEXED IN: Scopus WOS
IN MY: ResearcherID
200
TITLE: Optically active centers in Eu implanted, Eu in situ doped GaN, and Eu doped GaN quantum dots  Full Text
AUTHORS: Bodiou, L; Braud, A; L Doualan; Moncorge, R; Park, JH; Munasinghe, C; Steckl, AJ; Lorenz, K ; Alves, E ; Daudin, B;
PUBLISHED: 2009, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 105, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
Page 20 of 60. Total results: 597.

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