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Eduardo Jorge da Costa Alves
AuthID:
R-000-4EK
Publications
Confirmed
To Validate
Document Source:
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Document Type:
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Article (512)
Proceedings Paper (76)
Correction (4)
Review (2)
Editorial Material (2)
Erratum (1)
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Order:
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Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
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Results:
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Confirmed Publications: 597
331
TITLE:
Optical properties tailoring by high fluence implantation of Ag ions on sapphire
Full Text
AUTHORS:
Marques, C
;
da Silva, RC
;
Wemans, A
;
Maneira, MJP
; Kozanecki, A;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
14th International Conference on Ion Beam Modification of Materials (IBMM 2004)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
242,
ISSUE:
1-2
INDEXED IN:
Scopus
WOS
CrossRef
:
8
IN MY:
ORCID
|
ResearcherID
332
TITLE:
Optical studies on a coherent InGaN/GaN layer
Full Text
AUTHORS:
Correia, MR
;
Pereira, S
;
Alves, E
; Arnaudov, B;
PUBLISHED:
2006
,
SOURCE:
Symposium on Material Science and Technology of Wide Bandgap Semiconductors held at the 2006 Spring Meeting of the EMRS
in
SUPERLATTICES AND MICROSTRUCTURES,
VOLUME:
40,
ISSUE:
4-6
INDEXED IN:
Scopus
WOS
CrossRef
:
2
IN MY:
ORCID
|
ResearcherID
333
TITLE:
Phase separation on GaInAsSb films for thermophotovoltaic devices
AUTHORS:
Corregidor, V
;
Franco, N
;
Alves, E
;
Barradas, NP
;
PUBLISHED:
2006
,
SOURCE:
3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM)
in
ADVANCED MATERIALS FORUM III, PTS 1 AND 2,
VOLUME:
514-516,
ISSUE:
PART 1
INDEXED IN:
Scopus
WOS
CrossRef
:
1
IN MY:
ORCID
334
TITLE:
Phase transformation and structural studies of EUROFER RAFM alloy
AUTHORS:
Paul, A
; Beirante, A;
Franco, N
;
Alves, E
; Odriozola, JA;
PUBLISHED:
2006
,
SOURCE:
3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM)
in
ADVANCED MATERIALS FORUM III, PTS 1 AND 2,
VOLUME:
514-516,
ISSUE:
PART 1
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
335
TITLE:
Properties of MoNxOy thin films as a function of the N/O ratio
Full Text
AUTHORS:
Barbosa, J
;
Cunha, L
;
Rebouta, L
;
Moura, C
;
Vaz, F
;
Carvalho, S
;
Alves, E
; Le Bourhis, E;
Goudeau, P
; Riviere, JP;
PUBLISHED:
2006
,
SOURCE:
32nd International Conference on Metallurgical Coatings and Thin Film
in
THIN SOLID FILMS,
VOLUME:
494,
ISSUE:
1-2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
336
TITLE:
Radiation-induced defects in a-Si : H by 1.5 MeV He-4 particles studied by photoconductivity and photothermal deflection spectroscopy
Full Text
AUTHORS:
Morgado, E
;
Schwarz, R
; Braz, T; Casteleiro, C; Macarico, A;
Vieira, M
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
21st International Conference on Amorphous and Nanocrystalline Semiconductors
in
JOURNAL OF NON-CRYSTALLINE SOLIDS,
VOLUME:
352,
ISSUE:
9-20
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
337
TITLE:
Raman spectra and structural analysis in ZrOxNy thin films
Full Text
AUTHORS:
Moura, C
;
Carvalho, P
;
Vaz, F
;
Cunha, L
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
33rd International Conference on Metallurgical Coatings and Thin Films
in
THIN SOLID FILMS,
VOLUME:
515,
ISSUE:
3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
338
TITLE:
Rare earth ion implantation in GaN: Damage formation and recovery
AUTHORS:
Gloux, F; Ruterana, P; Wojtowicz, T;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
35th International School on the Physics of Semiconducting Compounds
in
ACTA PHYSICA POLONICA A,
VOLUME:
110,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
:
3
IN MY:
ORCID
339
TITLE:
RBS and XRD analysis of SiGe/Ge heterostructures for p-HMOS applications
Full Text
AUTHORS:
Franco, N
;
Alves, E
; Vallera, A; Morris, RJH; Mironov, OA; Parker, EHC;
Barradas, NP
;
PUBLISHED:
2006
,
SOURCE:
17th International Conference on Ion Beam Analysis
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
249,
ISSUE:
1-2 SPEC. ISS.
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
340
TITLE:
RBS/channeling study of buried Ge quantum dots grown in a Si layer
Full Text
AUTHORS:
Fonseca, A
;
Alves, E
;
Barradas, NP
;
P. Leitao
;
Sobolev, NA
;
Carmo, MC
; Nikiforov, AI; Presting, H;
PUBLISHED:
2006
,
SOURCE:
17th International Conference on Ion Beam Analysis
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
249,
ISSUE:
1-2 SPEC. ISS.
INDEXED IN:
Scopus
WOS
CrossRef
:
4
IN MY:
ORCID
|
ResearcherID
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