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Eduardo Jorge da Costa Alves
AuthID:
R-000-4EK
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Article (512)
Proceedings Paper (76)
Correction (4)
Review (2)
Editorial Material (2)
Erratum (1)
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IF Scopus Dsc
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Confirmed Publications: 597
361
TITLE:
Characterization and stability studies of titanium beryllides
Full Text
AUTHORS:
Alves, E
;
Alves, LC
;
Franco, N
;
da Silva, MR
; Paul, A; Hegeman, JB; Druyts, F;
PUBLISHED:
2005
,
SOURCE:
23rd Symposium on Fusion Technology (SOFT 23)
in
FUSION ENGINEERING AND DESIGN,
VOLUME:
75-79,
ISSUE:
SUPPL.
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
362
TITLE:
Characterization of silicon carbide thin films and their use in colour sensor
Full Text
AUTHORS:
Zhang, S
;
Raniero, L
;
Fortunato, E
; Liao, X; Hu, Z;
Ferreira, I
;
Aguas, H
;
Ramos, AR
;
Alves, E
;
Martins, R
;
PUBLISHED:
2005
,
SOURCE:
International Conference on Physics, Chemistry and Engineering of Solar Cells
in
SOLAR ENERGY MATERIALS AND SOLAR CELLS,
VOLUME:
87,
ISSUE:
1-4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
363
TITLE:
Comment on "Direct evidence of nanocluster-induced luminescence in InGaN epifilms" [Appl. Phys. Lett. 86, 021911 (2005)]
Full Text
AUTHORS:
Pereira, S
;
Correia, MR
;
Alves, E
; O'Donnell, KP; Chang, HJ; Chen, CH; Chen, YF; Lin, TY; Chen, LC; Chen, KH; Lan, ZH;
PUBLISHED:
2005
,
SOURCE:
APPLIED PHYSICS LETTERS,
VOLUME:
87,
ISSUE:
13
INDEXED IN:
Scopus
WOS
CrossRef
:
2
IN MY:
ORCID
|
ResearcherID
364
TITLE:
Compositional and structural characterisation of GaSb and GaInSb
Full Text
AUTHORS:
Corregidor, V
;
Alves, E
;
Alves, LC
;
Barradas, NP
; Duffar, T;
Franco, N
;
Marques, C
; Mitric, A;
PUBLISHED:
2005
,
SOURCE:
8th European Conference on Accelerators in Applied Research and Technology
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
240,
ISSUE:
1-2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
365
TITLE:
Damage formation and annealing at low temperatures in ion implanted ZnO
Full Text
AUTHORS:
Lorenz, K
;
Alves, E
;
Wendler, E
; Bilani, O; Wesch, W; Hayes, M;
PUBLISHED:
2005
,
SOURCE:
APPLIED PHYSICS LETTERS,
VOLUME:
87,
ISSUE:
19
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
366
TITLE:
Detection angle resolved PIXE and the equivalent depth concept for thin film characterization
Full Text
AUTHORS:
Miguel A. Reis
;
Chaves, PC
;
Corregidor, V
;
Barradas, NP
;
Alves, E
; Dimroth, F; Bett, AW;
PUBLISHED:
2005
,
SOURCE:
10th PIXE Conference
in
X-RAY SPECTROMETRY,
VOLUME:
34,
ISSUE:
4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
367
TITLE:
Direct evidence for As as a Zn-site impurity in ZnO
AUTHORS:
Wahl, U
; Rita, E;
Correia, JG
;
Marques, AC
;
Alves, E
;
Soares, JC
;
PUBLISHED:
2005
,
SOURCE:
PHYSICAL REVIEW LETTERS,
VOLUME:
95,
ISSUE:
21
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
368
TITLE:
High resolution backscattering studies of nanostructured magnetic and semiconducting materials
Full Text
AUTHORS:
Fonseca, A
;
Franco, N
;
Alves, E
;
Barradas, NP
;
Leitao, JP
;
Sobolev, NA
; Banhart, DF; Presting, H; Ulyanov, VV; Nikiforov, AI;
PUBLISHED:
2005
,
SOURCE:
18th International Conference on Application of Accelerators in Research and Industry (CAARI)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
241,
ISSUE:
1-4
INDEXED IN:
Scopus
WOS
CrossRef
:
13
IN MY:
ORCID
|
ResearcherID
369
TITLE:
Influence of nitrogen content on the structural, mechanical and electrical properties of TiN thin films
Full Text
AUTHORS:
Vaz, F
;
Ferreira, J
;
Ribeiro, E
;
Rebouta, L
;
Lanceros Mendez, S
;
Mendes, JA
;
Alves, E
;
Goudeau, P
; Riviere, JP;
Ribeiro, F
; Moutinho, I; Pischow, K;
de Rijk, J
;
PUBLISHED:
2005
,
SOURCE:
SURFACE & COATINGS TECHNOLOGY,
VOLUME:
191,
ISSUE:
2-3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
370
TITLE:
Ion beam analysis of GaInAsSb films grown by MOVPE on GaSb
Full Text
AUTHORS:
Corregidor, V
;
Barradas, NP
;
Alves, E
;
Franco, N
;
Alves, LC
;
Chaves, PC
;
Miguel A. Reis
;
PUBLISHED:
2005
,
SOURCE:
18th International Conference on Application of Accelerators in Research and Industry (CAARI)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
241,
ISSUE:
1-4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
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