Eduardo Jorge da Costa Alves


AuthID: R-000-4EK

Confirmed Publications: 597



391
TITLE: Characterisation of defects in rare earth implanted GaN by deep level transient spectroscopy  Full Text
AUTHORS: Colder, A; Marie, P; Wojtowicz, T; Ruterana, P; Eimer, S; Mechin, L; Lorenz, K ; Wahl, U ; Alves, E ; Matias, V; Mamor, M;
PUBLISHED: 2004, SOURCE: Meeting of the European-Materials-Research-Society in SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 36, ISSUE: 4-6
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
392
TITLE: Characterization of FePt nanoparticles in FePt/C multilayers  Full Text
AUTHORS: Barradas, NP ; Alves, E ; Babonneau, D;
PUBLISHED: 2004, SOURCE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
393
TITLE: Characterization of hard DC-sputtered Si-based TiN coatings: the effect of composition and ion bombardment  Full Text
AUTHORS: Ribeiro, E; Rebouta, L ; Carvalho, S ; Vaz, F ; Fuentes, GG; Rodriguez, R; Zazpe, M; Alves, E ; Goudeau, P; Riviere, JP;
PUBLISHED: 2004, SOURCE: 31st International Conference on Metallurgical Coatings and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 188, ISSUE: 1-3 SPEC.ISS.
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
394
TITLE: Comparative study of radiation damage in GaN and InGaN by 400 keV Au implantation  Full Text
AUTHORS: Wendler, E; Wesch, W; Alves, E ; Kamarou, A;
PUBLISHED: 2004, SOURCE: 12th International Conference on Radiation Effects in Insulators in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 218, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
395
TITLE: Compositional profiles in silica-based sol-gel films doped with erbium and silver, by RBS and ERDA  Full Text
AUTHORS: Marques, AC ; Almeida, RM ; Ramos, AR ; Alves, E ;
PUBLISHED: 2004, SOURCE: 12th International Workshop on Sol-Gel-Science and Technology (Sol-Gel 2003) in JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, VOLUME: 31, ISSUE: 1-3
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
396
TITLE: Copper nanocolloids in MgO crystals implanted with Cu ions  Full Text
AUTHORS: Savoini, B; Caceres, D; Gonzalez, R; Chen, Y; Pinto, JV ; da Silva, RC; Alves, E ;
PUBLISHED: 2004, SOURCE: 12th International Conference on Radiation Effects in Insulators in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 218, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
397
TITLE: Corrosion behaviour of single layered ZrN xO y thin films in artificial sweat solutions
AUTHORS: Ariza, E ; Rocha, LA; Ferreira, SC; Vaz, F ; Cunha, L ; Carvalho, P; Rebouta, L; Alves, E ; Ph Goudeau; Riviere, JP;
PUBLISHED: 2004, SOURCE: European Corrosion Conference: Long Term Prediction and Modelling of Corrosion, EUROCORR 2004 in EUROCORR 2004 - European Corrosion Conference: Long Term Prediction and Modelling of Corrosion
INDEXED IN: Scopus
IN MY: ORCID
398
TITLE: Corrosion resistance of ZrNxOy thin films obtained by rf reactive magnetron sputtering  Full Text
AUTHORS: Ariza, E ; Rocha, LA ; Vaz, F ; Cunha, L ; Ferreira, SC; Carvalho, P; Rebouta, L ; Alves, E ; Goudeau, P; Riviere, JP;
PUBLISHED: 2004, SOURCE: 31st International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 469, ISSUE: SPEC. ISS.
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
399
TITLE: Defect production in nitrogen implanted sapphire  Full Text
AUTHORS: Alves, E ; Marques, C; Ononye, LC; McHargue, C;
PUBLISHED: 2004, SOURCE: 12th International Conference on Radiation Effects in Insulators in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 218, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
400
TITLE: Degradation of particle detectors based on a-Si : H by 1.5 Mev He-4 and 1 MeV protons  Full Text
AUTHORS: Schwarz, R ; Braz, T; Sanguino, P; Ferreira, P; Macarico, A; Vieira, M ; Marques, C; Alves, E ;
PUBLISHED: 2004, SOURCE: 20th International Conference on Amorphous and Microcrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 338, ISSUE: 1 SPEC. ISS.
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
Page 40 of 60. Total results: 597.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service