Eduardo Jorge da Costa Alves


AuthID: R-000-4EK

Confirmed Publications: 597



401
TITLE: Direct evidence for strain inhomogeneity in InxGa1-xN epilayers by Raman spectroscopy  Full Text
AUTHORS: Correia, MR ; Pereira, S ; Pereira, E; Frandon, J; Watson, IM; Liu, C; Alves, E ; Sequeira, AD; Franco, N;
PUBLISHED: 2004, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 85, ISSUE: 12
INDEXED IN: Scopus WOS CrossRef: 16
IN MY: ORCID | ResearcherID
402
TITLE: Electrical conductivity of as-grown and oxidized MgO : Li crystals implanted with Li ions  Full Text
AUTHORS: Tardio, M; Ramirez, R; Gonzalez, R; Pinto, JV ; da Silva, RC; Alves, E ; Chen, Y;
PUBLISHED: 2004, SOURCE: 12th International Conference on Radiation Effects in Insulators in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 218, ISSUE: 1-4
INDEXED IN: Scopus WOS
IN MY: ResearcherID
403
TITLE: Exchange bias of MnPt/CoFe films prepared by ion beam deposition  Full Text
AUTHORS: Rickart, M; Freitas, PP ; Trindade, IG ; Barradas, NP ; Alves, E ; Salgueiro, M ; Muga, N ; Ventura, J ; Sousa, JB ; Proudfoot, G; Pearson, D; Davis, M;
PUBLISHED: 2004, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 95, ISSUE: 11
INDEXED IN: Scopus WOS CrossRef: 16
IN MY: ORCID | ResearcherID
404
TITLE: Extended X-ray absorption fine structure studies of thulium doped GaN epilayers  Full Text
AUTHORS: Katchkanov, V; Mosselmans, JFW; Dalmasso, S; O'Donnell, KP; Hernandez, S; Wang, K; Martin, RW; Briot, O; Rousseau, N; Halambalakis, G; Lorenz, K ; Alves, E ;
PUBLISHED: 2004, SOURCE: European Materials Research Society 2004, Symposium L. InN in Superlattices and Microstructures, VOLUME: 36, ISSUE: 4-6
INDEXED IN: Scopus CrossRef
IN MY: ORCID
405
TITLE: Formation of AlxGa1-xSb films over GaSb substrates by Al diffusion
AUTHORS: Ruiz, CM; Barradas, NP ; Alves, E ; Plaza, JL; Bermudez, V; Dieguez, E;
PUBLISHED: 2004, SOURCE: 10th International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (DRIP 10) in EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, VOLUME: 27, ISSUE: 1-3
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
406
TITLE: High-temperature annealing and optical activation of Eu-implanted GaN  Full Text
AUTHORS: Lorenz, K ; Wahl, U ; Alves, E ; Dalmasso, S; Martin, RW; O'Donnell, KP; Ruffenach, S; Briot, O;
PUBLISHED: 2004, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 85, ISSUE: 14
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
407
TITLE: Influence of O and C co-implantation on the lattice site of Er in GaN  Full Text
AUTHORS: De Vries, B; Matias, V; Vantomme, A; Wahl, U ; Rita, EMC; Alves, E ; Lopes, AML ; Correia, JG ; The ISOLDE Collaboration, ;
PUBLISHED: 2004, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 84, ISSUE: 21
INDEXED IN: Scopus WOS CrossRef: 14
IN MY: ORCID | ResearcherID
408
TITLE: Ion beam studies of single crystalline manganite thin films  Full Text
AUTHORS: Alves, E ; Marques, C; Amaral, VS ; Araujo, JP ; Cristiani, G; Habermeier, HU; Vieira, JM ;
PUBLISHED: 2004, SOURCE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
409
TITLE: Ion beam studies of TiNxOy thin films deposited by reactive magnetron sputtering  Full Text
AUTHORS: Alves, E ; Ramos, AR ; Barradas, NP ; Vaz, F ; Cerqueira, P; Rebouta, L ; Kreissig, U;
PUBLISHED: 2004, SOURCE: Symposium on Protective Coatings and Thin Films held at the E-MRS 20th Spring Meeting in SURFACE & COATINGS TECHNOLOGY, VOLUME: 180
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
410
TITLE: Lattice location and stability of implanted Cu in ZnO
AUTHORS: Wahl, U ; Rita, E; Correia, JG ; Alves, E ; Soares, JG;
PUBLISHED: 2004, SOURCE: PHYSICAL REVIEW B, VOLUME: 69, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
Page 41 of 60. Total results: 597.

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