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Fernando Manuel Tim Tim Janeiro
AuthID:
R-000-52M
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Proceedings Paper (19)
Article (15)
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Confirmed Publications: 34
1
TITLE:
Impedance frequency response measurements with multiharmonic stimulus and estimation algorithms in embedded systems
Full Text
AUTHORS:
Jose Santos;
Fernando M Janeiro
;
Pedro M Ramos
;
PUBLISHED:
2014
,
SOURCE:
MEASUREMENT,
VOLUME:
48,
ISSUE:
1
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
2
TITLE:
Defect Characterization With Eddy Current Testing Using Nonlinear-Regression Feature Extraction and Artificial Neural Networks
AUTHORS:
Rosado, LS;
Janeiro, FM
;
Ramos, PM
;
Piedade, M
;
PUBLISHED:
2013
,
SOURCE:
29th Annual IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
in
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
VOLUME:
62,
ISSUE:
5
INDEXED IN:
Scopus
WOS
CrossRef
Handle
IN MY:
ORCID
3
TITLE:
Gene expression programming for automatic circuit model identification in impedance spectroscopy: Performance evaluation
Full Text
AUTHORS:
Pedro M Ramos
;
Fernando M Janeiro
;
PUBLISHED:
2013
,
SOURCE:
IMEKO World Congress
in
MEASUREMENT,
VOLUME:
46,
ISSUE:
10
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
4
TITLE:
Gene Expression Programming in Sensor Characterization: Numerical Results and Experimental Validation
AUTHORS:
Fernando M Janeiro
; Jose Santos;
Pedro M Ramos
;
PUBLISHED:
2013
,
SOURCE:
29th Annual IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
in
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
VOLUME:
62,
ISSUE:
5
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
5
TITLE:
Automated cloud base height and wind speed measurement using consumer digital cameras
AUTHORS:
Janeiro, FM
; Carretas, F; Kandler, K;
Ramos, PM
; Wagner, F;
PUBLISHED:
2012
,
SOURCE:
20th IMEKO World Congress 2012
in
20th IMEKO World Congress 2012,
VOLUME:
2
INDEXED IN:
Scopus
IN MY:
ORCID
6
TITLE:
Eddy Currents Testing Defect Characterization based on Non-Linear Regressions and Artificial Neural Networks
Full Text
AUTHORS:
Luis Rosado
;
Pedro M Ramos
;
Fernando M Janeiro
;
Moises Piedade
;
PUBLISHED:
2012
,
SOURCE:
IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
in
2012 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
7
TITLE:
Implementation of sine-fitting algorithms in systems with 32-bit floating point representation
Full Text
AUTHORS:
Pedro M Ramos
;
Tomas Radil
;
Fernando M Janeiro
;
PUBLISHED:
2012
,
SOURCE:
MEASUREMENT,
VOLUME:
45,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
8
TITLE:
ON THE USE OF MULTI-HARMONIC LEAST-SQUARES FITTING FOR THD ESTIMATION IN POWER QUALITY ANALYSIS
AUTHORS:
Pedro M Ramos
;
Fernando M Janeiro
;
Tomas Radil
;
PUBLISHED:
2012
,
SOURCE:
METROLOGY AND MEASUREMENT SYSTEMS,
VOLUME:
19,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
9
TITLE:
Performance evaluation of gene expression programming in impedance spectroscopy for sensor modelling
AUTHORS:
Ramos, PM
;
Janeiro, FM
;
PUBLISHED:
2012
,
SOURCE:
20th IMEKO World Congress 2012
in
20th IMEKO World Congress 2012,
VOLUME:
3
INDEXED IN:
Scopus
IN MY:
ORCID
10
TITLE:
COMPARATIVE ANALYSIS OF THREE ALGORITHMS FOR TWO-CHANNEL COMMON FREQUENCY SINEWAVE PARAMETER ESTIMATION: ELLIPSE FIT, SEVEN PARAMETER SINE FIT AND SPECTRAL SINC FIT
AUTHORS:
Ramos, PM
;
Janeiro, FM
; Radil, T;
PUBLISHED:
2010
,
SOURCE:
METROLOGY AND MEASUREMENT SYSTEMS,
VOLUME:
17,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
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