1
TITLE: Impedance frequency response measurements with multiharmonic stimulus and estimation algorithms in embedded systems  Full Text
AUTHORS: Jose Santos; Fernando M Janeiro ; Pedro M Ramos;
PUBLISHED: 2014, SOURCE: MEASUREMENT, VOLUME: 48, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
2
TITLE: Defect Characterization With Eddy Current Testing Using Nonlinear-Regression Feature Extraction and Artificial Neural Networks
AUTHORS: Rosado, LS; Janeiro, FM ; Ramos, PM ; Piedade, M ;
PUBLISHED: 2013, SOURCE: 29th Annual IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, ISSUE: 5
INDEXED IN: Scopus WOS CrossRef Handle
IN MY: ORCID
3
TITLE: Gene expression programming for automatic circuit model identification in impedance spectroscopy: Performance evaluation  Full Text
AUTHORS: Pedro M Ramos ; Fernando M Janeiro ;
PUBLISHED: 2013, SOURCE: IMEKO World Congress in MEASUREMENT, VOLUME: 46, ISSUE: 10
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
4
TITLE: Gene Expression Programming in Sensor Characterization: Numerical Results and Experimental Validation
AUTHORS: Fernando M Janeiro ; Jose Santos; Pedro M Ramos ;
PUBLISHED: 2013, SOURCE: 29th Annual IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, ISSUE: 5
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
5
TITLE: Automated cloud base height and wind speed measurement using consumer digital cameras
AUTHORS: Janeiro, FM ; Carretas, F; Kandler, K; Ramos, PM ; Wagner, F;
PUBLISHED: 2012, SOURCE: 20th IMEKO World Congress 2012 in 20th IMEKO World Congress 2012, VOLUME: 2
INDEXED IN: Scopus
IN MY: ORCID
6
TITLE: Eddy Currents Testing Defect Characterization based on Non-Linear Regressions and Artificial Neural Networks  Full Text
AUTHORS: Luis Rosado; Pedro M Ramos ; Fernando M Janeiro ; Moises Piedade ;
PUBLISHED: 2012, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2012 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
7
TITLE: Implementation of sine-fitting algorithms in systems with 32-bit floating point representation  Full Text
AUTHORS: Pedro M Ramos ; Tomas Radil; Fernando M Janeiro ;
PUBLISHED: 2012, SOURCE: MEASUREMENT, VOLUME: 45, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
8
TITLE: ON THE USE OF MULTI-HARMONIC LEAST-SQUARES FITTING FOR THD ESTIMATION IN POWER QUALITY ANALYSIS
AUTHORS: Pedro M Ramos ; Fernando M Janeiro ; Tomas Radil;
PUBLISHED: 2012, SOURCE: METROLOGY AND MEASUREMENT SYSTEMS, VOLUME: 19, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
9
TITLE: Performance evaluation of gene expression programming in impedance spectroscopy for sensor modelling
AUTHORS: Ramos, PM ; Janeiro, FM ;
PUBLISHED: 2012, SOURCE: 20th IMEKO World Congress 2012 in 20th IMEKO World Congress 2012, VOLUME: 3
INDEXED IN: Scopus
IN MY: ORCID
10
TITLE: COMPARATIVE ANALYSIS OF THREE ALGORITHMS FOR TWO-CHANNEL COMMON FREQUENCY SINEWAVE PARAMETER ESTIMATION: ELLIPSE FIT, SEVEN PARAMETER SINE FIT AND SPECTRAL SINC FIT
AUTHORS: Ramos, PM ; Janeiro, FM ; Radil, T;
PUBLISHED: 2010, SOURCE: METROLOGY AND MEASUREMENT SYSTEMS, VOLUME: 17, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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