Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Fernando Manuel Tim Tim Janeiro
AuthID:
R-000-52M
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Proceedings Paper (19)
Article (15)
Year Start - End:
1999
2000
2001
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2014
2015
2016
2017
2018
2019
2020
2021
2022
2023
2024
-
2024
2023
2022
2021
2020
2019
2018
2017
2016
2015
2014
2013
2012
2011
2010
2009
2008
2007
2006
2005
2004
2003
2002
2001
2000
1999
Order:
Year Dsc
Year Asc
Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
Title Asc
Title Dsc
Results:
10
20
30
40
50
Confirmed Publications: 34
11
TITLE:
Developments of low-cost procedure to estimate cloud base height based on a digital camera
Full Text
AUTHORS:
Fernando M Janeiro
;
Pedro M Ramos
;
Frank Wagner
;
Silva, AM
;
PUBLISHED:
2010
,
SOURCE:
19th IMEKO World Congress
in
MEASUREMENT,
VOLUME:
43,
ISSUE:
5
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
12
TITLE:
Impedance Spectroscopy of a Vibrating Wire for Viscosity Measurements
Full Text
AUTHORS:
Janeiro, FM
;
Ramos, PM
;
Fareleira, JMNA
; Diogo, JCF; Maximo, DRC;
Caetano, FJP
;
PUBLISHED:
2010
,
SOURCE:
International Instrumentation and Measurement Technology Conference (I2MTC)
in
2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS
INDEXED IN:
Scopus
WOS
CrossRef
Handle
IN MY:
ORCID
13
TITLE:
Sine-fitting algorithms implemented in 32-bit floating point systems
AUTHORS:
Ramos, PM
;
Radil, T
;
Janeiro, FM
;
PUBLISHED:
2010
,
SOURCE:
17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
in
17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
INDEXED IN:
Scopus
IN MY:
ORCID
14
TITLE:
Uncertainty analysis of a cloud base height measurement system based on digital photography
AUTHORS:
Janeiro, FM
;
Wagner, F
;
Ramos, PM
;
Silva, AM
;
PUBLISHED:
2010
,
SOURCE:
17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
in
17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
INDEXED IN:
Scopus
IN MY:
ORCID
15
TITLE:
Application of Genetic Algorithms for Estimation of Impedance Parameters of Two-Terminal Networks
Full Text
AUTHORS:
Fernando M Janeiro
;
Pedro M Ramos
;
PUBLISHED:
2009
,
SOURCE:
26th IEEE International Instrumentation and Measurement Technology Conference
in
I2MTC: 2009 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
16
TITLE:
CLOUD BASE HEIGHT ESTIMATION USING A LOW-COST DIGITAL CAMERA
AUTHORS:
Fernando M Janeiro
;
Frank Wagner
;
Pedro M Ramos
;
Silva, AM
;
PUBLISHED:
2009
,
SOURCE:
19th IMEKO World Congress
in
XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS,
VOLUME:
3
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
17
TITLE:
Comparison of impedance measurements in a DSP using ellipse-fit and seven-parameter sine-fit algorithms
Full Text
AUTHORS:
Pedro M Ramos
;
Fernando M Janeiro
;
Tomas Radil
;
PUBLISHED:
2009
,
SOURCE:
MEASUREMENT,
VOLUME:
42,
ISSUE:
9
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
18
TITLE:
Impedance Measurements Using Genetic Algorithms and Multiharmonic Signals
AUTHORS:
Fernando M Janeiro
;
Pedro M Ramos
;
PUBLISHED:
2009
,
SOURCE:
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
VOLUME:
58,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
19
TITLE:
PERFORMANCE COMPARISON OF THREE ALGORITHMS FOR TWO-CHANNEL SINEWAVE PARAMETER ESTIMATION: SEVEN PARAMETER SINE FIT, ELLIPSE FIT, SPECTRAL SINC FIT
AUTHORS:
Pedro M Ramos
;
Fernando M Janeiro
;
Tomas Radil
;
PUBLISHED:
2009
,
SOURCE:
19th IMEKO World Congress
in
XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS,
VOLUME:
1
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
20
TITLE:
Recent Developments on Impedance Measurements With DSP-Based Ellipse-Fitting Algorithms
AUTHORS:
Pedro M Ramos
;
Fernando M Janeiro
;
Mouhaydine Tlemcani
;
Cruz C Serra
;
PUBLISHED:
2009
,
SOURCE:
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
VOLUME:
58,
ISSUE:
5
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
Add to Marked List
Check All
Export
×
Publication Export Settings
BibTex
EndNote
APA
CSV
PDF
Export Preview
Print
×
Publication Print Settings
HTML
PDF
Print Preview
Page 2 of 4. Total results: 34.
<<
<
1
2
3
4
>
>>
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service