João Filipe Horta Belo da Silva


AuthID: R-001-PF8

Confirmed Publications: 56



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TITLE: On the nature of the (de)coupling of the magnetostructural transition in Er5Si4. Nature of (de)coupling of magnetostructural transition in Er5 Si4   Full Text
AUTHORS: Costa, RM; Belo, JH ; Barbosa, MB; Algarabel, PA; Magen, C; Morellon, L; Ibarra, MR; Goncalves, JN; Fortunato, NM; Amaral, JS; Araujo, JP ; Pereira, AM ;
PUBLISHED: 2017, SOURCE: PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, VOLUME: 254, ISSUE: 10
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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TITLE: Annealing influence on the magnetostructural transition in Gd5Si1.3Ge2.7 thin films  Full Text
AUTHORS: Pires, AL ; Belo, JH ; Gomes, L; Hadimani, RL; Jiles, DC; Fernandes, L; Tavares, PB ; Araujo, JP ; Lopes, AML; Pereira, AM ;
PUBLISHED: 2015, SOURCE: MATERIALS LETTERS, VOLUME: 159
INDEXED IN: Scopus WOS CrossRef: 11
IN MY: ORCID
45
TITLE: Cryogenic Temperature Response of Reflection-Based Phase-Shifted Long-Period Fiber Gratings  Full Text
AUTHORS: Raquel Martins; Paulo Caldas ; Bruno Teixeira; Joao Azevedo; Jose Monteiro; Joao H Belo ; Joao P Araujo ; Jose L Santos ; Gaspar Rego ;
PUBLISHED: 2015, SOURCE: JOURNAL OF LIGHTWAVE TECHNOLOGY, VOLUME: 33, ISSUE: 12
INDEXED IN: Scopus WOS CrossRef: 15
IN MY: ORCID
46
TITLE: Femto Second Pulsed Laser Deposition of Nanoparticulate Thin Film of Gd-5(SixGe1-x)(4)
AUTHORS: Hadimani, RL; Shaw, AH; Schlagel, DL; Lograsso, TA; Da Silva, JH ; Pereira, AM ; Araujo, JP ; Balfou, EA; Fu, H; Jiles, D;
PUBLISHED: 2015, SOURCE: IEEE International Magnetics Conference (Intermag) in 2015 IEEE MAGNETICS CONFERENCE (INTERMAG)
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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TITLE: Influence of short time milling in R-5(Si,Ge)(4), R = Gd and Tb, magnetocaloric materials  Full Text
AUTHORS: Pires, AL ; Belo, JH ; Turcaud, J; G. N. P. Oliveira ; Araujo, JP ; Berenov, A; Cohen, LF; Lopes, AML; Pereira, AM ;
PUBLISHED: 2015, SOURCE: MATERIALS & DESIGN, VOLUME: 85
INDEXED IN: Scopus WOS CrossRef: 28
IN MY: ORCID
49
TITLE: On the growth and physical-chemical characterization of Tb5Si2Ge2 thin films produced by electron-beam evaporation
AUTHORS: Pires, AL ; Belo, JH ; Gomes, IT; Fernandes, L; Tavares, PB ; Lopes, AML; Pereira, AM ; Araujo, JP ;
PUBLISHED: 2015, SOURCE: 5th International Conference on Advanced Nanomaterials (ANM) in MATERIALS TODAY-PROCEEDINGS, VOLUME: 2, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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