Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Thiago Cerqueira de Jesus
AuthID:
R-00J-A7H
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Article (9)
Proceedings Paper (9)
Review (1)
Year Start - End:
2010
2011
2012
2013
2014
2015
2016
2017
2018
2019
2020
2021
2022
2023
2024
-
2024
2023
2022
2021
2020
2019
2018
2017
2016
2015
2014
2013
2012
2011
2010
Order:
Year Dsc
Year Asc
Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
Title Asc
Title Dsc
Results:
10
20
30
40
50
Confirmed Publications: 19
11
TITLE:
A Comprehensive Dependability Model for QoM-Aware Industrial WSN When Performing Visual Area Coverage in Occluded Scenarios
Full Text
AUTHORS:
Jesus, TC
;
Portugal, P
;
Costa, DG
;
Vasques, F
;
PUBLISHED:
2020
,
SOURCE:
SENSORS,
VOLUME:
20,
ISSUE:
22
INDEXED IN:
Scopus
WOS
DBLP
CrossRef
:
5
IN MY:
ORCID
12
TITLE:
FoV-Based Quality Assessment and Optimization for Area Coverage in Wireless Visual Sensor Networks
AUTHORS:
Jesus, TC
;
Costa, DG
;
Portugal, P
;
Vasques, F
;
PUBLISHED:
2020
,
SOURCE:
IEEE ACCESS,
VOLUME:
8
INDEXED IN:
Scopus
WOS
DBLP
CrossRef
:
5
IN MY:
ORCID
13
TITLE:
Modelling Coverage Failures Caused by Mobile Obstacles for the Selection of Faultless Visual Nodes in Wireless Sensor Networks
AUTHORS:
Thiago C Jesus
;
Daniel G Costa
;
Paulo Portugal
;
Francisco Vasques
;
Ana Aguiar
;
PUBLISHED:
2020
,
SOURCE:
IEEE ACCESS,
VOLUME:
8
INDEXED IN:
Scopus
WOS
DBLP
CrossRef
:
12
IN MY:
ORCID
14
TITLE:
An Availability Metric and Optimization Algorithms for Simultaneous Coverage of Targets and Areas by Wireless Visual Sensor Networks
AUTHORS:
Costa, DG
; Rangel, E; Peixoto, JPJ;
Jesus, TC
;
PUBLISHED:
2019
,
SOURCE:
17th IEEE International Conference on Industrial Informatics (INDIN)
in
2019 IEEE 17TH INTERNATIONAL CONFERENCE ON INDUSTRIAL INFORMATICS (INDIN),
VOLUME:
2019-July
INDEXED IN:
Scopus
WOS
CrossRef
:
1
IN MY:
ORCID
15
TITLE:
Wireless visual sensor networks redeployment based on dependability optimization
AUTHORS:
Thiago C Jesus
;
Daniel G Costa
;
Paulo Portugal
;
PUBLISHED:
2019
,
SOURCE:
17th IEEE International Conference on Industrial Informatics (INDIN)
in
2019 IEEE 17TH INTERNATIONAL CONFERENCE ON INDUSTRIAL INFORMATICS (INDIN),
VOLUME:
2019-July
INDEXED IN:
Scopus
WOS
DBLP
CrossRef
:
1
IN MY:
ORCID
16
TITLE:
Automated Methodology for Dependability Evaluation of Wireless Visual Sensor Networks
Full Text
AUTHORS:
Thiago C Jesus
;
Paulo Portugal
;
Francisco Vasques
;
Daniel G Costa
;
PUBLISHED:
2018
,
SOURCE:
SENSORS,
VOLUME:
18,
ISSUE:
8
INDEXED IN:
Scopus
WOS
DBLP
CrossRef
:
16
IN MY:
ORCID
17
TITLE:
On the Computing of Area Coverage by Visual Sensor Networks: Assessing Performance of Approximate and Precise Algorithms
AUTHORS:
Thiago C Jesus
;
Daniel G Costa
;
Paulo Portugal
;
PUBLISHED:
2018
,
SOURCE:
16th IEEE International Conference on Industrial Informatics (INDIN)
in
2018 IEEE 16TH INTERNATIONAL CONFERENCE ON INDUSTRIAL INFORMATICS (INDIN)
INDEXED IN:
Scopus
WOS
DBLP
CrossRef
:
8
IN MY:
ORCID
18
TITLE:
Polynomial time verification of decentralized diagnosability of discrete event systems
Full Text
AUTHORS:
Marcos V Moreira;
Thiago C Jesus
; João C Basilio;
PUBLISHED:
2011
,
SOURCE:
IEEE Transactions on Automatic Control,
VOLUME:
56,
ISSUE:
7
INDEXED IN:
Scopus
CrossRef
:
62
19
TITLE:
Polynomial time verification of decentralized diagnosability of discrete event systems
AUTHORS:
Marcos V Moreira;
Thiago C Jesus
; João C Basilio;
PUBLISHED:
2010
,
SOURCE:
Proceedings of the 2010 American Control Conference, ACC 2010
INDEXED IN:
Scopus
CrossRef
:
3
Add to Marked List
Check All
Export
×
Publication Export Settings
BibTex
EndNote
APA
CSV
PDF
Export Preview
Print
×
Publication Print Settings
HTML
PDF
Print Preview
Page 2 of 2. Total results: 19.
<<
<
1
2
>
>>
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service