José Alberto Peixoto Machado da Silva


AuthID: R-000-7Z3

Confirmed Publications: 95



61
TITLE: A low-power oscillation based LNA BIST scheme
AUTHORS: da Silva, JM ;
PUBLISHED: 2006, SOURCE: International Conference on Design and Test of Integrated Systems in Nanoscale Technology in IEEE DTIS: 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology, Proceedings
INDEXED IN: Scopus WOS CrossRef Handle
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62
TITLE: A high level test processor and test program generator
AUTHORS: Francisco X Duarte; José C Alves; José M da Silva ; António Pinho; José S Matos;
PUBLISHED: 2005
INDEXED IN: Handle
63
TITLE: A processor for testing mixed-signal cores in System-on-Chip
AUTHORS: Duarte, F; da Silva, JM ; Alves, JC ; Pinho, GA; Matos, JS ;
PUBLISHED: 2005, SOURCE: 8th Euromicro Conference on Digital System Design in DSD 2005: 8th Euromicro Conference on Digital System Design, Proceedings, VOLUME: 2005
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
64
TITLE: ADC Applications, Architectures and Terminology
AUTHORS: José Machado Silva ; Hélio Mendonça ;
PUBLISHED: 2005, SOURCE: The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
INDEXED IN: CrossRef: 1
IN MY: ORCID
65
TITLE: Comparative Study of ADC Sinewave Test Methods
AUTHORS: José Machado Silva ; Hélio Mendonça ; Sara Mazoleni;
PUBLISHED: 2005, SOURCE: The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
INDEXED IN: CrossRef
IN MY: ORCID
66
TITLE: Design for embedded testing of an LNA
AUTHORS: José M da Silva ; António Pinho; José S Matos;
PUBLISHED: 2005
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67
TITLE: Differential Gain and Phase Testing
AUTHORS: José Machado Silva ; Hélio Mendonça ;
PUBLISHED: 2005, SOURCE: The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
INDEXED IN: CrossRef
IN MY: ORCID
68
TITLE: Low-Power In-Circuit testing of a LNA
AUTHORS: José M da Silva ;
PUBLISHED: 2005
INDEXED IN: Handle
69
TITLE: Computing ADC harmonic content from a reduced number of values  Full Text
AUTHORS: Mendonca, HS ; da Silva, JM ; Matos, JS ;
PUBLISHED: 2003, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2, VOLUME: 2
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
70
TITLE: Functional in-circuit characterisation of Sigma Delta modulators  Full Text
AUTHORS: da Silva, JM ; Duarte, JS; Matos, JS ;
PUBLISHED: 2002, SOURCE: 6th Euro Workshop on ADC Modelling and Testing (EWADC in MEASUREMENT, VOLUME: 32, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
Page 7 of 10. Total results: 95.

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