11
TITLE: Editorial
AUTHORS: Perregrini, L; Pedro, JC ; Chen, W; Cheng, KKM; Li, CZ; Ma, KX; Momeni, O; Peng, Z; Rolfes, I; Tomassoni, C;
PUBLISHED: 2019, SOURCE: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOLUME: 67, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
12
TITLE: Hybrid Analog/Digital Linearization of GaN HEMT-Based Power Amplifiers
AUTHORS: Tome, PM; Barradas, FM; Cunha, TR; Pedro, JC ;
PUBLISHED: 2019, SOURCE: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOLUME: 67, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef: 27
IN MY: ORCID
13
TITLE: Impact of the Input Baseband Terminations on the Efficiency of Wideband Power Amplifiers under Concurrent Band Operation
AUTHORS: Barros, DR; Nunes, LC; Cabral, PM; Pedro, JC ;
PUBLISHED: 2019, SOURCE: IEEE Transactions on Microwave Theory and Techniques, VOLUME: 67, ISSUE: 12
INDEXED IN: Scopus CrossRef: 10
IN MY: ORCID
14
TITLE: Linearity and Efficiency in 5G Transmitters  Full Text
AUTHORS: Christian Fager; Thomas Eriksson; Filipe Barradas; Katharina Hausmair; Telmo Cunha; Jose Carlos Pedro ;
PUBLISHED: 2019, SOURCE: IEEE MICROWAVE MAGAZINE, VOLUME: 20, ISSUE: 5
INDEXED IN: WOS
15
TITLE: Linearity and Efficiency in 5G Transmitters: New Techniques for Analyzing Efficiency, Linearity, and Linearization in a 5G Active Antenna Transmitter Context
AUTHORS: Fager, C; Eriksson, T; Barradas, F; Hausmair, K; Cunha, T; Pedro, JC ;
PUBLISHED: 2019, SOURCE: IEEE Microwave Magazine, VOLUME: 20, ISSUE: 5
INDEXED IN: Scopus CrossRef: 117
IN MY: ORCID
16
TITLE: Memristive Properties of GaN HEMTs Containing Deep-Level Traps
AUTHORS: Gomes, JL; Nunes, LC; Sobolev, NA; Pedro, JC ;
PUBLISHED: 2019, SOURCE: Symposium K on Defect-Induced Effects in Nanomaterials at the Meeting of the European-Materials-Research-Society in PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, VOLUME: 256, ISSUE: 5
INDEXED IN: Scopus WOS CrossRef: 4
IN MY: ORCID
17
TITLE: Switch-Based Variable Length Stubs Network for PA Load Sensitivity Reduction
AUTHORS: Goncalves, CF; Barradas, FM; Cabral, PM; Pedro, JC ;
PUBLISHED: 2019, SOURCE: IEEE ACCESS, VOLUME: 7
INDEXED IN: Scopus WOS CrossRef: 13
IN MY: ORCID
18
TITLE: A Simple Method to Extract Trapping Time Constants of GaN HEMTs
AUTHORS: Nunes, LC; Gomes, JL; Cabral, PM; Pedro, JC ;
PUBLISHED: 2018, SOURCE: IEEE/MTT-S International Microwave Symposium in 2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS, VOLUME: 2018-June
INDEXED IN: Scopus WOS CrossRef: 13
19
TITLE: Editorial
AUTHORS: Perregrini, L; Pedro, JC ;
PUBLISHED: 2018, SOURCE: IEEE Transactions on Microwave Theory and Techniques, VOLUME: 66, ISSUE: 4
INDEXED IN: Scopus
IN MY: ORCID
20
TITLE: Editorial
AUTHORS: Perregrini, L; Pedro, JC ;
PUBLISHED: 2018, SOURCE: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOLUME: 66, ISSUE: 4
INDEXED IN: WOS CrossRef
IN MY: ORCID
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