Jose Carlos Magalhaes Duque da Fonseca


AuthID: R-000-870

Confirmed Publications: 62



61
TITLE: Characterisation of titanium passivation films by in situ ac impedance measurements and XPS analysis  Full Text
AUTHORS: da Fonseca, C ; Boudin, S; da Cunha Belo, M;
PUBLISHED: 1994, SOURCE: Journal of Electroanalytical Chemistry, VOLUME: 379, ISSUE: 1-2
INDEXED IN: Scopus CrossRef: 48
IN MY: ORCID
62
Page 7 of 7. Total results: 62.

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