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Katharina Lorenz
AuthID:
R-000-90E
Publications
Confirmed
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Document Source:
All
Document Type:
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Article (106)
Proceedings Paper (22)
Review (1)
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Confirmed Publications: 129
31
TITLE:
Rapid thermal annealing of rare earth implanted ZnO epitaxial layers
Full Text
AUTHORS:
Miranda, SMC
;
Peres, M
;
Monteiro, T
;
Alves, E
; Sun, HD; Geruschke, T; Vianden, R;
Lorenz, K
;
PUBLISHED:
2011
,
SOURCE:
Spring Meeting of the European-Materials-Research-Society
in
OPTICAL MATERIALS,
VOLUME:
33,
ISSUE:
7
INDEXED IN:
Scopus
WOS
CrossRef
:
18
IN MY:
ORCID
|
ResearcherID
32
TITLE:
Structural and optical properties of Er implanted AlN thin films: Green and infrared photoluminescence at room temperature
Full Text
AUTHORS:
Soares, MJ
;
Leitao, JP
; da Silva, MIN; Gonzalez, JC;
Matinaga, FM
;
Lorenz, K
;
Alves, E
;
Peres, M
;
Monteiro, T
;
PUBLISHED:
2011
,
SOURCE:
Spring Meeting of the European-Materials-Research-Society
in
OPTICAL MATERIALS,
VOLUME:
33,
ISSUE:
7
INDEXED IN:
Scopus
WOS
CrossRef
:
5
IN MY:
ORCID
|
ResearcherID
33
TITLE:
Ternary AlGaN Alloys with High Al Content and Enhanced Compositional Homogeneity Grown by Plasma-Assisted Molecular Beam Epitaxy
AUTHORS:
Vincent Fellmann
;
Perine Jaffrennou
;
Diane Sam Giao
;
Bruno Gayral
;
Katharina Lorenz
;
Eduardo Alves
;
Bruno Daudin
;
PUBLISHED:
2011
,
SOURCE:
JAPANESE JOURNAL OF APPLIED PHYSICS,
VOLUME:
50,
ISSUE:
3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
34
TITLE:
The high sensitivity of InN under rare earth ion implantation at medium range energy
Full Text
AUTHORS:
Lacroix, B; Chauvat, MP;
Ruterana, P
;
Lorenz, K
;
Alves, E
; Syrkin, A;
PUBLISHED:
2011
,
SOURCE:
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
VOLUME:
44,
ISSUE:
29
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
35
TITLE:
The photoluminescence/excitation (PL/E) spectroscopy of Eu-implanted GaN
Full Text
AUTHORS:
O'Donnell, KP; Roqan, IS; Ke Wang;
Lorenz, K
;
Alves, E
; Bockowski, M;
PUBLISHED:
2011
,
SOURCE:
Spring Meeting of the European-Materials-Research-Society
in
OPTICAL MATERIALS,
VOLUME:
33,
ISSUE:
7
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
36
TITLE:
The role of the annealing temperature on the optical and structural properties of Eu doped GaN/AlN QD
Full Text
AUTHORS:
Peres, M
;
Magalhaes, S
;
Rodrigues, J
;
Soares, MJ
; Fellmann, V;
Neves, AJ
;
Alves, E
; Daudin, B;
Lorenz, K
;
Monteiro, T
;
PUBLISHED:
2011
,
SOURCE:
Spring Meeting of the European-Materials-Research-Society (E-MRS)
in
OPTICAL MATERIALS,
VOLUME:
33,
ISSUE:
7
INDEXED IN:
Scopus
WOS
CrossRef
:
3
IN MY:
ORCID
|
ResearcherID
37
TITLE:
Unintentional incorporation of hydrogen in wurtzite InN with different surface orientations
Full Text
AUTHORS:
Darakchieva, V
;
Lorenz, K
; Y Xie;
Alves, E
; Hsiao, CL; Chen, LC; Tu, LW;
Schaff, WJ
; Yamaguchi, T; Nanishi, Y;
PUBLISHED:
2011
,
SOURCE:
JOURNAL OF APPLIED PHYSICS,
VOLUME:
110,
ISSUE:
6
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
38
TITLE:
Al1-xInxN/GaN bilayers: Structure, morphology, and optical properties
Full Text
AUTHORS:
Lorenz, K
;
Magalhaes, S
;
Franco, N
;
Barradas, NP
;
Darakchieva, V
;
Alves, E
;
Pereira, S
;
Correia, MR
; Munnik, F;
Martin, RW
; O'Donnell, KP;
Watson, IM
;
PUBLISHED:
2010
,
SOURCE:
E-MRS Fall Meeting on Wide Band Gap II-VI and III-V Semiconductors
in
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS,
VOLUME:
247,
ISSUE:
7
INDEXED IN:
Scopus
WOS
CrossRef
:
7
IN MY:
ORCID
|
ResearcherID
39
TITLE:
An In-defect complex as a possible explanation for high luminous efficacy of InGaN and AlInN based devices
Full Text
AUTHORS:
Kessler, P;
Lorenz, K
;
Miranda, SMC
;
Correia, JG
; Johnston, K; Vianden, R;
PUBLISHED:
2010
,
SOURCE:
3rd Joint International Conference on Hyperfine Interactions (HFI) / International Symposium on Nuclear Quadrupole Interactions (NQI)
in
HYPERFINE INTERACTIONS,
VOLUME:
197,
ISSUE:
1-3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
40
TITLE:
Defect studies and optical activation of Yb doped GaN
Full Text
AUTHORS:
Lorenz, K
;
Alves, E
; Magalhes, S;
Peres, M
;
Monteiro, T
; Kozanecki, A; Valerio, MEG;
PUBLISHED:
2010
,
SOURCE:
16th International Conference on Defects in Insulating Materials, ICDIM2008
in
Journal of Physics: Conference Series,
VOLUME:
249
INDEXED IN:
Scopus
CrossRef
:
2
IN MY:
ORCID
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