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Katharina Lorenz
AuthID:
R-000-90E
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Article (106)
Proceedings Paper (22)
Review (1)
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Confirmed Publications: 129
51
TITLE:
Optical doping and damage formation in AlN by Eu implantation
Full Text
AUTHORS:
Lorenz, K
;
Alves, E
;
Gloux, F
;
Ruterana, P
;
Peres, M
;
Neves, AJ
;
Monteiro, T
;
PUBLISHED:
2010
,
SOURCE:
JOURNAL OF APPLIED PHYSICS,
VOLUME:
107,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
:
27
IN MY:
ORCID
|
ResearcherID
52
TITLE:
RE Implantation and Annealing of III-Nitrides
AUTHORS:
Katharina Lorenz
;
Eduardo Alves
;
Florence Gloux
;
Pierre Ruterana
;
PUBLISHED:
2010
,
SOURCE:
RARE EARTH DOPED III-NITRIDES FOR OPTOELECTRONIC AND SPINTRONIC APPLICATIONS,
VOLUME:
124
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
53
TITLE:
The Characterization of N Interstitials and Dangling Bond Point Defects on Ion-Implanted GaN Nanowires Studied by Photoluminescence and X-Ray Absorption Spectroscopy. Rapid Communications of the American Ceramic Society
Full Text
AUTHORS:
Kuo Hao Lee; Jau Wern Chiou; Jin Ming Chen; Jyh Fu Lee; Alain Braud;
Katharina Lorenz
;
Eduardo Alves
; In Gann Chen;
PUBLISHED:
2010
,
SOURCE:
JOURNAL OF THE AMERICAN CERAMIC SOCIETY,
VOLUME:
93,
ISSUE:
11
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
54
TITLE:
Thin film depth profiling using simultaneous particle backscattering and nuclear resonance profiling
Full Text
AUTHORS:
Barradas, NP
;
Mateus, R
;
Fonseca, M.
;
Miguel A. Reis
;
Lorenz, K
;
Vickridge, I
;
PUBLISHED:
2010
,
SOURCE:
19th International Conference on Ion Beam Analysis
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
268,
ISSUE:
11-12
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
55
TITLE:
Total reflectance and Raman studies in AlyInxGa1-x-yN epitaxial layers
Full Text
AUTHORS:
Margarida M Bola
;
Correia, MR
;
Pereira, S
; Gonzalez, JC;
Lorenz, K
;
Alves, E
;
Barradas, N
;
PUBLISHED:
2010
,
SOURCE:
Symposium on Group III Nitride Semiconductors held at the 2009 EMRS Spring Meeting
in
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7, NO 1,
VOLUME:
7,
ISSUE:
1
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
56
TITLE:
Alloy and lattice disorder in Hf implanted AlxGa1-xN (0 <= x <= 1)
Full Text
AUTHORS:
Thomas Geruschke;
Katharina Lorenz
; Reiner Vianden;
PUBLISHED:
2009
,
SOURCE:
25th International Conference on Defects in Semiconductors
in
PHYSICA B-CONDENSED MATTER,
VOLUME:
404,
ISSUE:
23-24
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
57
TITLE:
Breakdown of anomalous channeling with ion energy for accurate strain determination in GaN-based heterostructures
Full Text
AUTHORS:
Redondo Cubero, A
;
Lorenz, K
; Gago, R;
Franco, N
; Fernandez Garrido, S; Smulders, PJM; Munoz, E; Calleja, E;
Watson, IM
;
Alves, E
;
PUBLISHED:
2009
,
SOURCE:
APPLIED PHYSICS LETTERS,
VOLUME:
95,
ISSUE:
5
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
58
TITLE:
Europium doping of zincblende GaN by ion implantation
Full Text
AUTHORS:
Lorenz, K
; Roqan, IS;
Franco, N
; O'Donnell, KP;
Darakchieva, V
;
Alves, E
; Trager Cowan, C;
Martin, RW
; As, DJ; Panfilova, M;
PUBLISHED:
2009
,
SOURCE:
JOURNAL OF APPLIED PHYSICS,
VOLUME:
105,
ISSUE:
11
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
59
TITLE:
Influence of steering effects on strain detection in AlGaInN/GaN heterostructures by ion channelling
Full Text
AUTHORS:
Redondo Cubero, A
;
Lorenz, K
;
Franco, N
; Fernandez Garrido, S; Gago, R; Smulders, PJM; Munoz, E; Calleja, E;
Alves, E
;
PUBLISHED:
2009
,
SOURCE:
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
VOLUME:
42,
ISSUE:
6
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
60
TITLE:
Influence of the AlN molar fraction on the structural and optical properties of praseodymium-doped AlxGa1-xN (0 <= x <= 1) alloys
Full Text
AUTHORS:
Peres, M
;
Magalhaes, S
;
Franco, N
;
Soares, MJ
;
Neves, AJ
;
Alves, E
;
Lorenz, K
;
Monteiro, T
;
PUBLISHED:
2009
,
SOURCE:
Symposium on Wide Band Gap Semiconductor Nanostructures for Optoelectronic Applications held at the 2008 E-MRS Conference
in
MICROELECTRONICS JOURNAL,
VOLUME:
40,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
:
13
IN MY:
ORCID
|
ResearcherID
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