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Luís António Carvalho Gachineiro da Cunha
AuthID:
R-000-9BG
Publications
Confirmed
To Validate
Document Source:
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Document Type:
All Document Types
Article (50)
Proceedings Paper (4)
Review (1)
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Order:
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Cit. WOS Dsc
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Cit. Scopus Dsc
IF Scopus Dsc
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Results:
10
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Confirmed Publications: 55
31
TITLE:
The influence of structure changes in the properties of TiCxOy decorative thin films
Full Text
AUTHORS:
Fernandes, AC
;
Vaz, F
;
Cunha, L
;
Parreira, NMG
;
Cavaleiro, A
;
Ph. Goudeau
; Le Bourhis, E; Riviere, JP; Munteanu, D; Borcea, B; Cozma, R;
PUBLISHED:
2007
,
SOURCE:
THIN SOLID FILMS,
VOLUME:
515,
ISSUE:
13
INDEXED IN:
Scopus
WOS
CrossRef
:
19
IN MY:
ORCID
32
TITLE:
Compositional and structural changes in ZrOxNy films depending on growth condition
Full Text
AUTHORS:
Carvalho, P
;
Fernandes, AC
;
Rebouta, L
;
Vaz, F
;
Cunha, L
; Kreissig, U;
Barradas, NP
;
Ramos, AR
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
17th International Conference on Ion Beam Analysis
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
249,
ISSUE:
1-2 SPEC. ISS.
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
33
TITLE:
Properties of MoNxOy thin films as a function of the N/O ratio
Full Text
AUTHORS:
Barbosa, J
;
Cunha, L
;
Rebouta, L
;
Moura, C
;
Vaz, F
;
Carvalho, S
;
Alves, E
; Le Bourhis, E;
Goudeau, P
; Riviere, JP;
PUBLISHED:
2006
,
SOURCE:
32nd International Conference on Metallurgical Coatings and Thin Film
in
THIN SOLID FILMS,
VOLUME:
494,
ISSUE:
1-2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
34
TITLE:
Raman spectra and structural analysis in ZrOxNy thin films
Full Text
AUTHORS:
Moura, C
;
Carvalho, P
;
Vaz, F
;
Cunha, L
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
33rd International Conference on Metallurgical Coatings and Thin Films
in
THIN SOLID FILMS,
VOLUME:
515,
ISSUE:
3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
35
TITLE:
Structural evolution in ZrNxOy thin films as a function of temperature
Full Text
AUTHORS:
Cunha, L
;
Vaz, F
;
Moura, C
;
Rebouta, L
;
Carvalho, P
;
Alves, E
;
Cavaleiro, A
;
Goudeau, P
; Riviere, JP;
PUBLISHED:
2006
,
SOURCE:
SURFACE & COATINGS TECHNOLOGY,
VOLUME:
200,
ISSUE:
9
INDEXED IN:
Scopus
WOS
CrossRef
:
39
IN MY:
ORCID
36
TITLE:
Tribocorrosion behaviour of ZrOxNy thin films for decorative applications
Full Text
AUTHORS:
Ferreira, SC
;
Ariza, E
;
Rocha, LA
;
Gomes, JR
;
Carvalho, P
;
Vaz, F
;
Fernandes, AC
;
Rebouta, L
;
Cunha, L
;
Alves, E
;
Goudeau, P
; Riviere, JP;
PUBLISHED:
2006
,
SOURCE:
Symposium on Protective Coatings and Thin Films held at the E-MRS Spring Meeting
in
SURFACE & COATINGS TECHNOLOGY,
VOLUME:
200,
ISSUE:
22-23
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
37
TITLE:
Corrosion resistance of multilayer coatings deposited by PVD techniques onto the brass substrate
Full Text
AUTHORS:
Dobrzanski, LA; Lukaszkowicz, K; Zarychta, A;
Cunha, L
;
PUBLISHED:
2005
,
SOURCE:
8th International Conference on Advances in Materials and Processing Technologies/13th International Conference on Achievements in Mechanical and Materials Engineering
in
JOURNAL OF MATERIALS PROCESSING TECHNOLOGY,
VOLUME:
164
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
38
TITLE:
Structural and optical characterization of decorative ZrOxN y thin films
AUTHORS:
Carvalho, P
;
Vaz, F
;
Cunha, L
;
Rebouta, L
;
Tavares, CJ
;
Moura, C
;
Alves, E
;
Cavaleiro, A
; Ph Godeau; Le Bourhis, E; Riviere, JP;
PUBLISHED:
2005
,
SOURCE:
SVC, Society of Vacuum Coaters - 48th Annual Technical Conference
in
Proceedings, Annual Technical Conference - Society of Vacuum Coaters
INDEXED IN:
Scopus
IN MY:
ORCID
39
TITLE:
Structural stability of decorative ZrNxOy thin films
Full Text
AUTHORS:
Carvalho, P
;
Vaz, F
;
Rebouta, L
;
Carvalho, S
;
Cunha, L
;
Goudeau, P
; Riviere, JP;
Alves, E
;
Cavaleiro, A
;
PUBLISHED:
2005
,
SOURCE:
9th International Conference on Plasma Surface Engineering
in
SURFACE & COATINGS TECHNOLOGY,
VOLUME:
200,
ISSUE:
1-4
INDEXED IN:
Scopus
WOS
CrossRef
:
20
IN MY:
ORCID
40
TITLE:
Structural, electrical, optical, and mechanical characterizations of decorative ZrOxNy thin films
Full Text
AUTHORS:
Carvalho, P;
Vaz, F
;
Rebouta, L
;
Cunha, L
;
Tavares, CJ
;
Moura, C
;
Alves, E
;
Cavaleiro, A
; Goudeau, P; Le Bourhis, E; Riviere, JP; Pierson, JF; Banakh, O;
PUBLISHED:
2005
,
SOURCE:
JOURNAL OF APPLIED PHYSICS,
VOLUME:
98,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
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