Maria Benilde Faria de Oliveira e Costa
AuthID: R-000-ANJ
141
TITLE: On the influence of tin on the formation of the σ-phase in the FeCr system
AUTHORS: Costa, BFO; Dubiel, SM;
PUBLISHED: 1993, SOURCE: Physica Status Solidi (a) - Phys. Stat. Sol. (a), VOLUME: 139, ISSUE: 1
AUTHORS: Costa, BFO; Dubiel, SM;
PUBLISHED: 1993, SOURCE: Physica Status Solidi (a) - Phys. Stat. Sol. (a), VOLUME: 139, ISSUE: 1
142
TITLE: 1ST SN-119 MOSSBAUER-EFFECT STUDY OF THE SIGMA-PHASE IN THE FE-CR SYSTEM Full Text
AUTHORS: DUBIEL, SM; COSTA, BFO; DECAMPOS, NA;
PUBLISHED: 1992, SOURCE: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, VOLUME: 115, ISSUE: 2-3
AUTHORS: DUBIEL, SM; COSTA, BFO; DECAMPOS, NA;
PUBLISHED: 1992, SOURCE: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, VOLUME: 115, ISSUE: 2-3
INDEXED IN: 
WOS
WOS IN MY: ResearcherID
ResearcherID143
TITLE: Diagnosis of ischemic cardiopathy in ambulatory care patients. Multivariate analysis of clinical and electrocardiographic data [Diagnóstico de cardiopatia isquémica no doente ambulatório. Análise multivariada de dados clínicos e electrocardiográficos.]
AUTHORS: Macieira Coelho, E; Oliveira, MF; Turkman, MA ;
PUBLISHED: 1990, SOURCE: Acta medica portuguesa, VOLUME: 3, ISSUE: 5
AUTHORS: Macieira Coelho, E; Oliveira, MF; Turkman, MA ;
PUBLISHED: 1990, SOURCE: Acta medica portuguesa, VOLUME: 3, ISSUE: 5
INDEXED IN: 
Scopus
Scopus144
TITLE: X-Ray Fluorescence Spectrometry With Gas Proportional Scintillation Counters
AUTHORS: C.A.N Conde; J.M.F dos Santos; Teresa H.V.T Dias; A.J.A de Campos; Benilde F.O Costa;
PUBLISHED: 1987, SOURCE: Advances in X-ray Analysis, VOLUME: 31
AUTHORS: C.A.N Conde; J.M.F dos Santos; Teresa H.V.T Dias; A.J.A de Campos; Benilde F.O Costa;
PUBLISHED: 1987, SOURCE: Advances in X-ray Analysis, VOLUME: 31
145
TITLE: Window Area Effects in the Detector Efficiency for Source Excited EDXRF Geometries
AUTHORS: J.M.F dos Santos; Benilde E.O Costa;
PUBLISHED: 1987, SOURCE: Advances in X-ray Analysis, VOLUME: 31
AUTHORS: J.M.F dos Santos; Benilde E.O Costa;
PUBLISHED: 1987, SOURCE: Advances in X-ray Analysis, VOLUME: 31
