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TITLE: Study of the 300-mm CoSi2 defects induced by Soft Sputter Etch process before cobalt deposition - Characterization, design of experiment and 200/300 mm comparison  Full Text
AUTHORS: Humbert, A; Regnier, C; Braeckelmann, G; Basso, MT; Ferreira, P;
PUBLISHED: 2004, SOURCE: Materials Science and Engineering B: Solid-State Materials for Advanced Technology, VOLUME: 114-115, ISSUE: SPEC. ISS.
INDEXED IN: Scopus CrossRef: 2
IN MY: ORCID
22
TITLE: Parallel Operating Systems
AUTHORS: João Garcia; Paulo Ferreira; Paulo Guedes;
PUBLISHED: 2000, SOURCE: Handbook on Parallel and Distributed Processing
INDEXED IN: DBLP
IN MY: DBLP
Page 3 of 3. Total results: 22.