Paulo Jorge Pires Ferreira
AuthID: R-000-EF4
21
TITLE: Study of the 300-mm CoSi2 defects induced by Soft Sputter Etch process before cobalt deposition - Characterization, design of experiment and 200/300 mm comparison Full Text
AUTHORS: Humbert, A; Regnier, C; Braeckelmann, G; Basso, MT; Ferreira, P;
PUBLISHED: 2004, SOURCE: Materials Science and Engineering B: Solid-State Materials for Advanced Technology, VOLUME: 114-115, ISSUE: SPEC. ISS.
AUTHORS: Humbert, A; Regnier, C; Braeckelmann, G; Basso, MT; Ferreira, P;
PUBLISHED: 2004, SOURCE: Materials Science and Engineering B: Solid-State Materials for Advanced Technology, VOLUME: 114-115, ISSUE: SPEC. ISS.
22
TITLE: Parallel Operating Systems
AUTHORS: João Garcia; Paulo Ferreira; Paulo Guedes;
PUBLISHED: 2000, SOURCE: Handbook on Parallel and Distributed Processing
AUTHORS: João Garcia; Paulo Ferreira; Paulo Guedes;
PUBLISHED: 2000, SOURCE: Handbook on Parallel and Distributed Processing
INDEXED IN: DBLP
IN MY: DBLP