Wael Dghais
AuthID: R-004-NF5
11
TITLE: Empirical modelling of FDSOI CMOS inverter for signal/power integrity simulation
AUTHORS: Wael Dghais; Jonathan Rodriguez;
PUBLISHED: 2015, SOURCE: Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015
AUTHORS: Wael Dghais; Jonathan Rodriguez;
PUBLISHED: 2015, SOURCE: Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015
INDEXED IN: 
DBLP
DBLP12
TITLE: Memristor state-space embedding
AUTHORS: Wael Dghais; Luis Nero Alves; Joana Catarina Mendes; Jonathan Rodriguez; José Carlos Pedro;
PUBLISHED: 2015, SOURCE: European Conference on Circuit Theory and Design, ECCTD 2015, Trondheim, Norway, August 24-26, 2015
AUTHORS: Wael Dghais; Luis Nero Alves; Joana Catarina Mendes; Jonathan Rodriguez; José Carlos Pedro;
PUBLISHED: 2015, SOURCE: European Conference on Circuit Theory and Design, ECCTD 2015, Trondheim, Norway, August 24-26, 2015
INDEXED IN: DBLP
DBLP13
TITLE: UTTB FDSOI Back-Gate Biasing for Low Power and High-Speed Chip Design
AUTHORS: Wael Dghais; Jonathan Rodriguez;
PUBLISHED: 2014, SOURCE: Wireless Internet - 8th International Conference, WICON 2014, Lisbon, Portugal, November 13-14, 2014, Revised Selected Papers, VOLUME: 146
AUTHORS: Wael Dghais; Jonathan Rodriguez;
PUBLISHED: 2014, SOURCE: Wireless Internet - 8th International Conference, WICON 2014, Lisbon, Portugal, November 13-14, 2014, Revised Selected Papers, VOLUME: 146
INDEXED IN: DBLP
DBLP14
TITLE: Novel Extraction of a Table-Based I-Q Behavioral Model for High-Speed Digital Buffers/Drivers Full Text
AUTHORS: Wael Dghais; Hugo. M Teixeira; Telmo R Cunha ; Jose C Pedro ;
PUBLISHED: 2013, SOURCE: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, VOLUME: 3, ISSUE: 3
AUTHORS: Wael Dghais; Hugo. M Teixeira; Telmo R Cunha ; Jose C Pedro ;
PUBLISHED: 2013, SOURCE: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, VOLUME: 3, ISSUE: 3
15
TITLE: Measurement Setup for RF/Digital Buffers Characterization
AUTHORS: Hugo M Teixeira; Wael Dghais; Telmo Reis Cunha ; Jose C Pedro ;
PUBLISHED: 2013, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, ISSUE: 7
AUTHORS: Hugo M Teixeira; Wael Dghais; Telmo Reis Cunha ; Jose C Pedro ;
PUBLISHED: 2013, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, ISSUE: 7
16
TITLE: A Novel Two-Port Behavioral Model for I/O Buffer Overclocking Simulation Full Text
AUTHORS: Wael Dghais; Telmo Reis Cunha; Jose Carlos Pedro ;
PUBLISHED: 2013, SOURCE: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, VOLUME: 3, ISSUE: 10
AUTHORS: Wael Dghais; Telmo Reis Cunha; Jose Carlos Pedro ;
PUBLISHED: 2013, SOURCE: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, VOLUME: 3, ISSUE: 10
17
TITLE: Reduced-Order Parametric Behavioral Model for Digital Buffers/Drivers With Physical Support Full Text
AUTHORS: Wael Dghais; Telmo R Cunha ; Jose C Pedro ;
PUBLISHED: 2012, SOURCE: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, VOLUME: 2, ISSUE: 12
AUTHORS: Wael Dghais; Telmo R Cunha ; Jose C Pedro ;
PUBLISHED: 2012, SOURCE: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, VOLUME: 2, ISSUE: 12
18
TITLE: A Mixed-Domain Behavioral Model's Extraction for Digital I/O Buffers
AUTHORS: Wael Dghais; Telmo R Cunha ; Jose C Pedro ;
PUBLISHED: 2012, SOURCE: IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) in 2012 IEEE 21ST CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS
AUTHORS: Wael Dghais; Telmo R Cunha ; Jose C Pedro ;
PUBLISHED: 2012, SOURCE: IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) in 2012 IEEE 21ST CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS
19
TITLE: Efficient table-based I-Q behavioral model for high-speed digital buffers/drivers
AUTHORS: Dghais, W; Teixeira, HM; Cunha, TR ; Pedro, JC ;
PUBLISHED: 2012, SOURCE: 2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 in 2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 - Proceedings
AUTHORS: Dghais, W; Teixeira, HM; Cunha, TR ; Pedro, JC ;
PUBLISHED: 2012, SOURCE: 2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 in 2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 - Proceedings
20
TITLE: Behavioral model for high-speed digital buffer/driver
AUTHORS: Dghais, W; Cunha, TR ; Pedro, JC ;
PUBLISHED: 2010, SOURCE: 2010 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2010 in 2010 Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2010 - Conference Proceedings
AUTHORS: Dghais, W; Cunha, TR ; Pedro, JC ;
PUBLISHED: 2010, SOURCE: 2010 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2010 in 2010 Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2010 - Conference Proceedings
