Dário Jerónimo Pasadas
AuthID: R-004-V7M
31
TITLE: Using Excitation Invariance in the Characterization of Defects by Eddy Current Image Constructions
AUTHORS: Lopes Ribeiro, AL; Pasadas, D; Ramos, HG ; Rocha, T;
PUBLISHED: 2014, SOURCE: 1st International Conference on Structural Integrity (ICONS) in STRUCTURAL INTEGRITY, VOLUME: 86, ISSUE: C
AUTHORS: Lopes Ribeiro, AL; Pasadas, D; Ramos, HG ; Rocha, T;
PUBLISHED: 2014, SOURCE: 1st International Conference on Structural Integrity (ICONS) in STRUCTURAL INTEGRITY, VOLUME: 86, ISSUE: C
32
TITLE: Assessing metal plate thickness: An SVM approach with electromagnetic methods
AUTHORS: Ramos, HG ; Rocha, T; Kral, J; Pasadas, D; Ribeiro, AL ;
PUBLISHED: 2013, SOURCE: 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications in 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications, Proceedings
AUTHORS: Ramos, HG ; Rocha, T; Kral, J; Pasadas, D; Ribeiro, AL ;
PUBLISHED: 2013, SOURCE: 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications in 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications, Proceedings
INDEXED IN: 
Scopus
Scopus33
TITLE: Velocity Induced Eddy Currents Technique to Inspect Cracks in Moving Conducting Media Full Text
AUTHORS: Geirinhas Ramos, HMG ; Rocha, T; Dario Pasadas; Lopes Ribeiro, AL ;
PUBLISHED: 2013, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2013 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
AUTHORS: Geirinhas Ramos, HMG ; Rocha, T; Dario Pasadas; Lopes Ribeiro, AL ;
PUBLISHED: 2013, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2013 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
34
TITLE: Remote Field Eddy Current Inspection of Metallic Tubes Using GMR Sensors Full Text
AUTHORS: Dario J Pasadas; Tiago J Rocha; Helena G Ramos ; Lopes Ribeiro, AL ;
PUBLISHED: 2013, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2013 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
AUTHORS: Dario J Pasadas; Tiago J Rocha; Helena G Ramos ; Lopes Ribeiro, AL ;
PUBLISHED: 2013, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2013 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
35
TITLE: Evaluation of portable ECT instruments with positioning capability Full Text
AUTHORS: Dario Pasadas; Jorge J Rocha; Helena Geirinhas Ramos ; Lopes L Ribeiro ;
PUBLISHED: 2012, SOURCE: MEASUREMENT, VOLUME: 45, ISSUE: 3
AUTHORS: Dario Pasadas; Jorge J Rocha; Helena Geirinhas Ramos ; Lopes L Ribeiro ;
PUBLISHED: 2012, SOURCE: MEASUREMENT, VOLUME: 45, ISSUE: 3
36
TITLE: Current around a Crack in an Aluminum Plate under Nondestructive Evaluation Inspection Full Text
AUTHORS: Lopes Ribeiro, AL ; Geirinhas Ramos, HG ; Jeronimo Pasadas, DJ; Jorge Rocha, TJ;
PUBLISHED: 2012, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2012 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
AUTHORS: Lopes Ribeiro, AL ; Geirinhas Ramos, HG ; Jeronimo Pasadas, DJ; Jorge Rocha, TJ;
PUBLISHED: 2012, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2012 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
37
TITLE: Characterization of Defects on Rivets using a Eddy Current Technique with GMRs Full Text
AUTHORS: Tiago Rocha; Dario Pasadas; Lopes Ribeiro, AL ; Helena M Ramos ;
PUBLISHED: 2012, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2012 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
AUTHORS: Tiago Rocha; Dario Pasadas; Lopes Ribeiro, AL ; Helena M Ramos ;
PUBLISHED: 2012, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2012 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
38
TITLE: Handheld Instrument to Detect Defects in Conductive Plates with a Planar Probe Full Text
AUTHORS: Dario Pasadas; Helena Geirinhas Ramos ; Francisco Alegria ;
PUBLISHED: 2011, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2011 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
AUTHORS: Dario Pasadas; Helena Geirinhas Ramos ; Francisco Alegria ;
PUBLISHED: 2011, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2011 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
39
TITLE: Portable eddy current NDT instrument using two different implementations
AUTHORS: Pasadas, D; Rocha, T; Ramos, H ; Ribeiro, AL ;
PUBLISHED: 2011, SOURCE: International Conference on Computer as a Tool, EUROCON 2011 - Joint with Conftele 2011 in EUROCON 2011 - International Conference on Computer as a Tool - Joint with Conftele 2011
AUTHORS: Pasadas, D; Rocha, T; Ramos, H ; Ribeiro, AL ;
PUBLISHED: 2011, SOURCE: International Conference on Computer as a Tool, EUROCON 2011 - Joint with Conftele 2011 in EUROCON 2011 - International Conference on Computer as a Tool - Joint with Conftele 2011
INDEXED IN: Scopus 
CrossRef
Scopus CrossRef40
TITLE: 2D Magnetic Field Mobile Sensing System for Eddy Current Testing
AUTHORS: Bruno Silva; Dario Pasadas; Frederico Carvalho; Pedro Agulha; Octavian Postolache ; Helena G Ramos ; Lopes Ribeiro, AL ; Correa Alegria, FC ;
PUBLISHED: 2009, SOURCE: 8th IEEE Conference on Sensors in 2009 IEEE SENSORS, VOLS 1-3
AUTHORS: Bruno Silva; Dario Pasadas; Frederico Carvalho; Pedro Agulha; Octavian Postolache ; Helena G Ramos ; Lopes Ribeiro, AL ; Correa Alegria, FC ;
PUBLISHED: 2009, SOURCE: 8th IEEE Conference on Sensors in 2009 IEEE SENSORS, VOLS 1-3
