2
TITLE: Spatially-resolved photocapacitance measurements to study defects in a-Si : H based p-i-n particle detectors  Full Text
AUTHORS: Casteleiro, C; Schwarz, R ; Mardolcar, U; Macarico, A; Martins, J; Vieira, M ; Wuensch, F; Kunst, M; Morgado, E; Stallinga, P ; Gomes, HL ;
PUBLISHED: 2008, SOURCE: THIN SOLID FILMS, VOLUME: 516, ISSUE: 15
INDEXED IN: Scopus WOS CrossRef
3
TITLE: Stability of GaN films under intense MeV He ion irradiation  Full Text
AUTHORS: Schwarz, R ; Cabeca, R; Morgado, E; Niehus, M; Ambacher, O; Marques, CP; Alves, E ;
PUBLISHED: 2007, SOURCE: 17th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes, Nitrides and Silicon Carbide in DIAMOND AND RELATED MATERIALS, VOLUME: 16, ISSUE: 4-7
INDEXED IN: Scopus WOS CrossRef
4
TITLE: Radiation-induced defects in a-Si : H by 1.5 MeV He-4 particles studied by photoconductivity and photothermal deflection spectroscopy  Full Text
AUTHORS: Morgado, E; Schwarz, R ; Braz, T; Casteleiro, C; Macarico, A; Vieira, M ; Alves, E ;
PUBLISHED: 2006, SOURCE: 21st International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 352, ISSUE: 9-20
INDEXED IN: Scopus WOS CrossRef
5
TITLE: Influence of light-soaking and annealing on electron and hole mobility-lifetime products in a-Si : H  Full Text
AUTHORS: Morgado, E;
PUBLISHED: 2004, SOURCE: 20th International Conference on Amorphous and Microcrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 338, ISSUE: 1 SPEC. ISS.
INDEXED IN: Scopus WOS CrossRef
6
TITLE: Light-soaking and annealing kinetics of majority and minority carrier mobility-lifetime products in a-Si : H  Full Text
AUTHORS: Morgado, E;
PUBLISHED: 2002, SOURCE: 19th International Conference on Amorphous and Microcrystalline Semiconductors (ICAMS 19) in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 299, ISSUE: PART 1
INDEXED IN: Scopus WOS CrossRef
7
TITLE: Defect-related photoinduced absorption in amorphous silicon  Full Text
AUTHORS: Morgado, E;
PUBLISHED: 2001, SOURCE: 21st International Conference on Defects in Semiconductors in PHYSICA B-CONDENSED MATTER, VOLUME: 308
INDEXED IN: Scopus WOS CrossRef
8
TITLE: New results on the modulated photocarrier grating technique  Full Text
AUTHORS: Morgado, E; Diez, J; Schwarz, R ; Macarico, A; Koynov, S;
PUBLISHED: 2000, SOURCE: 18th International Conference on Amorphous and Microcrystalline Semiconductors (ICAMS 18) in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 266
INDEXED IN: Scopus WOS CrossRef
9
TITLE: Microcrystalline silicon thin films for optical applications  Full Text
AUTHORS: Vieira, M ; Morgado, E; Macarico, A; Koynov, S; Schwarz, R ;
PUBLISHED: 1999, SOURCE: 2nd European Conference on Hard Coatings (ETCHC-2)/3rd Iberian Vacuum Meeting (3rd RIVA) in VACUUM, VOLUME: 52, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
10
TITLE: A two-dimensional visible/infrared detector based on mu c-Si : H p-i-n structures  Full Text
AUTHORS: Vieira, M ; Macarico, A; Morgado, E; Koynov, S; Schwarz, R ;
PUBLISHED: 1998, SOURCE: 17th International Conference on Amorphous and Microcrystalline Semiconductors - Science and Technology (ICAMS 17) in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 227, ISSUE: PART 2
INDEXED IN: Scopus WOS CrossRef
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