141
TITLE: Influence of the deposition pressure on the properties of transparent and conductive ZnO: Ga thin-film produced by r.f. sputtering at room temperature  Full Text
AUTHORS: Elvira Fortunato; V. Assunção; A. Marques; Hugo Águas; Rodrigo Martins; Costa, M. E. V.;
PUBLISHED: 2003
INDEXED IN: Handle
142
TITLE: High quality a-Si:H films for MIS device applications  Full Text
AUTHORS: Águas, H; Fortunato, E; Silva, V; Pereira, L; Martins, R;
PUBLISHED: 2002, SOURCE: Thin Solid Films, VOLUME: 403-404
INDEXED IN: CrossRef
IN MY: ORCID
143
TITLE: Influence of a DC grid on silane r.f. plasma properties  Full Text
AUTHORS: Hugo Águas; Elvira Fortunato; Rodrigo Martins;
PUBLISHED: 2002, SOURCE: Vacuum, VOLUME: 64, ISSUE: 3-4
INDEXED IN: CrossRef
IN MY: ORCID
144
TITLE: Role of the i layer surface properties on the performance of a-Si:H Schottky barrier photodiodes  Full Text
AUTHORS: Águas, H; Fortunato, E; Martins, R;
PUBLISHED: 2002, SOURCE: Sensors and Actuators A: Physical, VOLUME: 99, ISSUE: 1-2
INDEXED IN: CrossRef
IN MY: ORCID
145
TITLE: Thin film metal oxide semiconductors deposited on polymeric substrates
AUTHORS: Fortunato, E; Nunes, P; Marques, A; Costa, D; Aguas, H; Ferreira, I; Costa, MEV; Martins, R;
PUBLISHED: 2001, SOURCE: Transport and Microstructural Phenomena in Oxide Electronics in Materials Research Society Symposium - Proceedings, VOLUME: 666
INDEXED IN: Scopus
IN MY: ORCID
146
TITLE: Role of ion bombardment on the properties of a-Si:H films  Full Text
AUTHORS: Hugo Águas; Martins, R; Fortunato, E;
PUBLISHED: 2001, SOURCE: Vacuum, VOLUME: 60, ISSUE: 1-2
INDEXED IN: CrossRef
IN MY: ORCID
147
TITLE: Fast and cheap method to qualitatively measure the thickness and uniformity of ZrO2 thin films  Full Text
AUTHORS: Hugo Águas; António Marques; Rodrigo Martins; Elvira Fortunato;
PUBLISHED: 2001, SOURCE: Materials Science in Semiconductor Processing, VOLUME: 4, ISSUE: 1-3
INDEXED IN: CrossRef
IN MY: ORCID
149
Page 15 of 16. Total results: 153.