José Miguel Costa Dias Pereira
AuthID: R-000-8RJ
121
TITLE: Next Generation Application Processor Based on the IEEE 1451.1 Standard and Web Services Full Text
AUTHORS: Vitor Viegas; Dias M D Pereira; Silva S Girao;
PUBLISHED: 2008, SOURCE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
AUTHORS: Vitor Viegas; Dias M D Pereira; Silva S Girao;
PUBLISHED: 2008, SOURCE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
122
TITLE: Distributed Instrumentation and Geographic Information System for Dolphins' Environment Assessment Full Text
AUTHORS: Postolache, O ; Girao, PS; Patricio, G; Sacramento, J; Macedo, P; Pereira, MD;
PUBLISHED: 2008, SOURCE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
AUTHORS: Postolache, O ; Girao, PS; Patricio, G; Sacramento, J; Macedo, P; Pereira, MD;
PUBLISHED: 2008, SOURCE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
123
TITLE: NDT on Aluminum Aircraft Plates based on Eddy Current Sensing and Image Processing Full Text
AUTHORS: Postolache, O ; Pereira, MD; Ramos, HG ; Lopes L Ribeiro;
PUBLISHED: 2008, SOURCE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
AUTHORS: Postolache, O ; Pereira, MD; Ramos, HG ; Lopes L Ribeiro;
PUBLISHED: 2008, SOURCE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
124
TITLE: Research on Missing Value Estimation in Data Mining
AUTHORS: Deng Chao Feng; Zhe Wang; Jian Fang Shi; Dias M D Pereira;
PUBLISHED: 2008, SOURCE: 7th World Congress on Intelligent Control and Automation in 2008 7TH WORLD CONGRESS ON INTELLIGENT CONTROL AND AUTOMATION, VOLS 1-23
AUTHORS: Deng Chao Feng; Zhe Wang; Jian Fang Shi; Dias M D Pereira;
PUBLISHED: 2008, SOURCE: 7th World Congress on Intelligent Control and Automation in 2008 7TH WORLD CONGRESS ON INTELLIGENT CONTROL AND AUTOMATION, VOLS 1-23
125
TITLE: A brief tutorial on the IEEE 1451.1 Standard - Part 13 in a series of tutorials in instrumentation and measurement Full Text
AUTHORS: Viegas, V; Dias Pereira, JM; Silva Girao, PMB ;
PUBLISHED: 2008, SOURCE: IEEE Instrumentation and Measurement Magazine, VOLUME: 11, ISSUE: 2
AUTHORS: Viegas, V; Dias Pereira, JM; Silva Girao, PMB ;
PUBLISHED: 2008, SOURCE: IEEE Instrumentation and Measurement Magazine, VOLUME: 11, ISSUE: 2
126
TITLE: Dolphins' environment assessment and knowledge management using a distributed instrumentation and geographic information system
AUTHORS: Postolache, O ; Apolonia, J; Beirante, N; Macedo, P ; Pereira, MD; Girao, P;
PUBLISHED: 2008, SOURCE: 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session in 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
AUTHORS: Postolache, O ; Apolonia, J; Beirante, N; Macedo, P ; Pereira, MD; Girao, P;
PUBLISHED: 2008, SOURCE: 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session in 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
INDEXED IN: 
Scopus
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ORCID
ORCID127
TITLE: Improving accuracy and linearity of low-cost flow meters
AUTHORS: Pereira, MD; Postolache, O ; Girao, PS;
PUBLISHED: 2008, SOURCE: 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session in 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
AUTHORS: Pereira, MD; Postolache, O ; Girao, PS;
PUBLISHED: 2008, SOURCE: 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session in 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
INDEXED IN: Scopus
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ORCID128
TITLE: A brief tutorial on the IEEE 1451.1 standard
AUTHORS: Viegas, V; Pereira, M; Girao, P;
PUBLISHED: 2008, SOURCE: IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, VOLUME: 11, ISSUE: 2
AUTHORS: Viegas, V; Pereira, M; Girao, P;
PUBLISHED: 2008, SOURCE: IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, VOLUME: 11, ISSUE: 2
INDEXED IN: 
WOS
WOS IN MY: ORCID
ORCID129
TITLE: .NET Framework and web services: A profit combination to implement and enhance the IEEE 1451.1 standard
AUTHORS: Vitor Viegas; Dias Pereira, JMD; Silva Girao, PMBS ;
PUBLISHED: 2007, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 56, ISSUE: 6
AUTHORS: Vitor Viegas; Dias Pereira, JMD; Silva Girao, PMBS ;
PUBLISHED: 2007, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 56, ISSUE: 6
130
TITLE: Multibeam optical system and neural processing for turbidity measurement Full Text
AUTHORS: Octavian A Postolache ; Silva M B S Girao; Dias M D Pereira; Helena Maria G Ramos ;
PUBLISHED: 2007, SOURCE: IEEE SENSORS JOURNAL, VOLUME: 7, ISSUE: 5-6
AUTHORS: Octavian A Postolache ; Silva M B S Girao; Dias M D Pereira; Helena Maria G Ramos ;
PUBLISHED: 2007, SOURCE: IEEE SENSORS JOURNAL, VOLUME: 7, ISSUE: 5-6
