Chevrier
AuthID: R-002-XQA
11
TITLE: Periodic X-ray standing waves in quasiperiodic systems
AUTHORS: Schmithusen, F; Cappello, G; Chevrier, J;
PUBLISHED: 2001, SOURCE: APERIODIC Conference in Ferroelectrics, VOLUME: 250, ISSUE: 1-4
AUTHORS: Schmithusen, F; Cappello, G; Chevrier, J;
PUBLISHED: 2001, SOURCE: APERIODIC Conference in Ferroelectrics, VOLUME: 250, ISSUE: 1-4
INDEXED IN: Scopus
IN MY: ORCID
12
TITLE: Composition and chemical bonding of pulsed laser deposited carbon nitride thin films
AUTHORS: Riedo, E; Comin, F; Chevrier, J; Bonnot, AM;
PUBLISHED: 2000, SOURCE: Journal of Applied Physics, VOLUME: 88, ISSUE: 7
AUTHORS: Riedo, E; Comin, F; Chevrier, J; Bonnot, AM;
PUBLISHED: 2000, SOURCE: Journal of Applied Physics, VOLUME: 88, ISSUE: 7
INDEXED IN: Scopus
IN MY: ORCID
13
TITLE: Study of the response of the fivefold i-AlPdMn surface to different temperature treatments Full Text
AUTHORS: Schmithusen, F; Cappello, G; De Boissieu, M; Boudard, M; Comin, F; Chevrier, J;
PUBLISHED: 2000, SOURCE: Surface Science, VOLUME: 444, ISSUE: 1
AUTHORS: Schmithusen, F; Cappello, G; De Boissieu, M; Boudard, M; Comin, F; Chevrier, J;
PUBLISHED: 2000, SOURCE: Surface Science, VOLUME: 444, ISSUE: 1
INDEXED IN: Scopus
14
TITLE: Electron energy loss spectroscopy investigation of volume and surface plasmons at the Al-Pd-Mn fivefold surface Full Text
AUTHORS: Schmithusen, F; De Boissieu, M; Boudard, M; Chevrier, J; Comin, F;
PUBLISHED: 2000, SOURCE: Materials Science and Engineering A, VOLUME: 294-296
AUTHORS: Schmithusen, F; De Boissieu, M; Boudard, M; Chevrier, J; Comin, F;
PUBLISHED: 2000, SOURCE: Materials Science and Engineering A, VOLUME: 294-296
INDEXED IN: Scopus
15
TITLE: Characterization and properties of the AlPdMn 5 surface
AUTHORS: Cappello, G; Dechelette, A; Schmithusen, F; Chevrier, J; Comin, F; Stierle, A; Formoso, V; De Boissieu, M; Lograsso, T; Jenks, C; Delaney, D;
PUBLISHED: 1999, SOURCE: Proceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998' in Materials Research Society Symposium - Proceedings, VOLUME: 553
AUTHORS: Cappello, G; Dechelette, A; Schmithusen, F; Chevrier, J; Comin, F; Stierle, A; Formoso, V; De Boissieu, M; Lograsso, T; Jenks, C; Delaney, D;
PUBLISHED: 1999, SOURCE: Proceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998' in Materials Research Society Symposium - Proceedings, VOLUME: 553
INDEXED IN: Scopus
IN MY: ORCID
16
TITLE: Combined X-ray and STM study of the oxygen-induced restructuring of the Au(111) surface
AUTHORS: Ortega, L; Huang, L; Chevrier, J; Zeppenfeld, P; Gay, JM; Rieutord, F; Comsa, G;
PUBLISHED: 1997, SOURCE: Surface Review and Letters, VOLUME: 4, ISSUE: 6
AUTHORS: Ortega, L; Huang, L; Chevrier, J; Zeppenfeld, P; Gay, JM; Rieutord, F; Comsa, G;
PUBLISHED: 1997, SOURCE: Surface Review and Letters, VOLUME: 4, ISSUE: 6
INDEXED IN: Scopus
IN MY: ORCID
17
TITLE: Characterization by scanning tunneling microscopy of the oxygen induced restructuring of Au(111) Full Text
AUTHORS: Chevrier, J; Huang, L; Zeppenfeld, P; Comsa, G;
PUBLISHED: 1996, SOURCE: Surface Science, VOLUME: 355, ISSUE: 1-3
AUTHORS: Chevrier, J; Huang, L; Zeppenfeld, P; Comsa, G;
PUBLISHED: 1996, SOURCE: Surface Science, VOLUME: 355, ISSUE: 1-3
INDEXED IN: Scopus
IN MY: ORCID
18
TITLE: Gallium-mediated homoepitaxial growth of silicon at low temperatures
AUTHORS: Gallas, B; Berbezier, I; Chevrier, J; Derrien, J;
PUBLISHED: 1996, SOURCE: Physical Review B - Condensed Matter and Materials Physics, VOLUME: 54, ISSUE: 7
AUTHORS: Gallas, B; Berbezier, I; Chevrier, J; Derrien, J;
PUBLISHED: 1996, SOURCE: Physical Review B - Condensed Matter and Materials Physics, VOLUME: 54, ISSUE: 7
INDEXED IN: Scopus
IN MY: ORCID
19
TITLE: High-resolution electron microscopy study of αFeSi2 heteroepitaxy on Si(111) Full Text
AUTHORS: Berbezier, I; Chevrier, J; Derrien, J;
PUBLISHED: 1994, SOURCE: Surface Science, VOLUME: 315, ISSUE: 1-2
AUTHORS: Berbezier, I; Chevrier, J; Derrien, J;
PUBLISHED: 1994, SOURCE: Surface Science, VOLUME: 315, ISSUE: 1-2
INDEXED IN: Scopus
IN MY: ORCID
20
TITLE: Influence of kinetic roughening on the epitaxial growth of silicon
AUTHORS: Chevrier, J; Cruz, A; Pinto, N; Berbezier, I; Derrien, J;
PUBLISHED: 1994, SOURCE: Journal de physique. III, VOLUME: 4, ISSUE: 9
AUTHORS: Chevrier, J; Cruz, A; Pinto, N; Berbezier, I; Derrien, J;
PUBLISHED: 1994, SOURCE: Journal de physique. III, VOLUME: 4, ISSUE: 9
INDEXED IN: Scopus
IN MY: ORCID