Reliability Analysis of an Electronic Portal Imaging Device (Epid) of a Linear Accelerator

AuthID
 P-00Y-P0Q
2
Author(s)
Gouveia, C
·
Document Type
Proceedings Paper
Year published
2023
Published
in 2023 IEEE 7TH PORTUGUESE MEETING ON BIOENGINEERING, ENBENG in Portuguese Meeting on Bioengineering, ISSN: 2377-8563
Pages: 52-55 (4)
Conference
Ieee 7Th Portuguese Meeting on Bioengineering (Enbeng), Date: JUN 22-23, 2023, Location: Porto, PORTUGAL
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Publication Identifiers
Scopus: 2-s2.0-85166486677
Wos: WOS:001032626300014
Source Identifiers
ISSN: 2377-8563
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