Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Characterization of Silicon Carbide Thin Films Prepared by Vhf-Pecvd Technology
AuthID
P-000-9YR
10
Author(s)
Zhang, S
·
Raniero, L
·
Fortunato, E
·
Pereira, L
·
Martins, N
·
Canhola, P
·
Ferreira, I
·
Nedev, N
·
Aguas, H
·
Martins, R
Document Type
Article
Year published
2004
Published
in
JOURNAL OF NON-CRYSTALLINE SOLIDS,
ISSN: 0022-3093
Volume: 338, Issue: 1 SPEC. ISS., Pages: 530-533 (4)
Conference
20Th International Conference on Amorphous and Microcrystalline Semiconductors,
Date:
AUG 25-29, 2003,
Location:
Campos do Jordao, BRAZIL
Indexing
Wos
®
Scopus
®
Crossref
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1016/j.jnoncrysol.2004.03.035
SCOPUS
: 2-s2.0-2942528965
Wos
: WOS:000222219000118
Source Identifiers
ISSN
: 0022-3093
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service