Cdte Detector Use for Pixe Characterization of Tbcofe Thin Films

AuthID
 P-003-6FN
4
Author(s)
Document Type
Article
Year published
2010
Published
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X
Volume: 268, Issue: 11-12, Pages: 2010-2014 (5)
Conference
19Th International Conference on Ion Beam Analysis, Date: SEP 07-11, 2009, Location: Cambridge, ENGLAND, Host: Univ Cambridge
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Publication Identifiers
Scopus: 2-s2.0-77953130995
Wos: WOS:000278702300069
Source Identifiers
ISSN: 0168-583X
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