Growth and Characterisation of Nial and N-Doped Nial Films Deposited by Closed Field Unbalanced Magnetron Sputtering Ion Plating Using Elemental Ni and Al Targets

AuthID
 P-003-7YG
5
Author(s)
Said, R
·
Ahmed, W
·
Abuain, T
·
Abuazza, A
·
Document Type
Article
Year published
2010
Published
in JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, ISSN: 1533-4880
Volume: 10, Issue: 4, Pages: 2600-2605 (6)
Conference
2Nd International Conference on Advanced Nano Materials, Date: 2008, Location: Aveiro, PORTUGAL, Host: Univ Aveiro
Indexing
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Publication Identifiers
Pubmed: 20355470
SCOPUS: 2-s2.0-77954964518
Wos: WOS:000273984900049
Source Identifiers
ISSN: 1533-4880
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