Roughness in Gan/Ingan Films and Multilayers Determined with Rutherford Backscattering

AuthID
 P-000-AP9
11
Author(s)
O'Donnell, KP
·
Liu, C
·
Mayer, M
Document Type
Article
Year published
2004
Published
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X
Volume: 217, Issue: 3, Pages: 479-497 (19)
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Scopus®
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Publication Identifiers
Scopus: 2-s2.0-11144354261
Wos: WOS:000221016600014
Source Identifiers
ISSN: 0168-583X
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