Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Impedance Measurement Using Sine Fitting Algorithms
AuthID
P-011-R47
3
Author(s)
Fonseca da Silva M.
·
Miguel Ramos P.
·
Manuel da Cruz Serra A.
Document Type
Proceedings Paper
Year published
2002
Published
in
12th IMEKO TC4 International Symposium Electrical Measurements and Instrumentation
Pages: 199-204 (5)
Indexing
Scopus
®
Metadata
Sources
Publication Identifiers
SCOPUS
: 2-s2.0-84962052646
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service