Publications

Erbium-Doped Nanocrystalline Silicon Thin Films Produced by Rf Sputtering - Annealing Effect on the Er Emission

AuthID
P-003-C99

Author(s)

Cerqueira, MF

Kozanecki, A

Editor(s)

Schropp,REI

Document Type

Proceedings Paper

Year published

2010

Published

in PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7 NO 3-4 in Physica Status Solidi C-Current Topics in Solid State Physics, ISSN: 1610-1634

Volume: 7, Issue: 3-4, Pages: 683-687 (5)

Conference

23Rd International Conference on Amorphous and Nanocrystalline Semiconductors (Icans23), Date: AUG 23-28, 2009, Location: Utrecht, NETHERLANDS, Sponsors: Utrecht University, Faculty of Science;Inst. Energieforschung - Photovoltaik, Forschungszent. Jul.;Sunfilm AG;Stichting Physica;Foundation for Fundamental Research on Matter

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