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The Impact of Long-Term Memory Effects on Diode Power Probes
AuthID
P-003-DDP
5
Author(s)
Gomes, H
·
Testera, AR
·
Carvalho, NB
·
Barciela, MF
·
Remley, KA
Document Type
Abstract
Year published
2010
Published
in
2010 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST (MTT)
in
IEEE MTT-S International Microwave Symposium,
ISSN: 0149-645X
Conference
Ieee Mtt-S International Microwave Symposium Digest,
Date:
MAY 23-28, 2010,
Location:
Anaheim, CA,
Sponsors:
IEEE
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: WOS:000288196502057
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ISSN
: 0149-645X
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