The Impact of Long-Term Memory Effects on Diode Power Probes

AuthID
 P-003-DDT
5
Author(s)
Testera, AR
·
Barciela, MF
·
Remley, KA
Document Type
Proceedings Paper
Year published
2010
Published
in 2010 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST (MTT) in IEEE MTT-S International Microwave Symposium, ISSN: 0149-645X
Pages: 596-599 (4)
Conference
Ieee Mtt-S International Microwave Symposium Digest, Date: MAY 23-28, 2010, Location: Anaheim, CA, Sponsors: IEEE
Indexing
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Publication Identifiers
Scopus: 2-s2.0-77957769400
Wos: WOS:000288196500151
Source Identifiers
ISSN: 0149-645X
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