Bias Stress and Temperature Impact on Ingazno Tfts and Circuits

AuthID
 P-012-6HS
7
Author(s)
Martins J.
·
Bahubalindruni P.
·
Rovisco A.
·
Kiazadeh A.
·
Document Type
Article
Year published
2017
Published
in Materials
Volume: 10, Issue: 6, Pages: 680
Indexing
Scopus®
Crossref®23
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85021134282
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