Expanding the Ieee 1057 Standard Jitter Test of Waveform Recorders to Include Simultaneous Voltage Noise Estimation

AuthID
 P-012-B68
1
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Document Type
Article
Year published
2024
Published
in IEEE ACCESS, ISSN: 2169-3536
Volume: 12, Pages: 103018-103025 (8)
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Publication Identifiers
SCOPUS: 2-s2.0-85200462000
Wos: WOS:001283751000001
Source Identifiers
ISSN: 2169-3536
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