X-Ray Analysis of Multi-Films for Electrochromic Device Application

AuthID
P-000-B2B
4
Author(s)
Jia, S
·
Document Type
Article
Year published
2004
Published
in MICROCHIMICA ACTA, ISSN: 1436-5073
Volume: 145, Issue: 1-4, Pages: 19-23 (5)
Conference
8Th Workshop of the European-Microbeam-Analysis-Society, Date: MAY 18-22, 2003, Location: Chiclana de la Frontera, SPAIN, Sponsors: European Microbeam Anal Soc, Acerinox SA, Blackwell Publ Ltd, Cambridge Univ Press, Cameca SA, Edax Europe, European commiss, JRC, Inst Transuranium Elements
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Publication Identifiers
SCOPUS: 2-s2.0-2942673114
Wos: WOS:000221453500004
Source Identifiers
ISSN: 1436-5073
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