Soft X-Ray Free Electron Laser Microfocus for Exploring Matter Under Extreme Conditions

AuthID
P-003-FQ8
34
Author(s)
Nelson, AJ
·
Toleikis, S
·
Chapman, H
·
Bajt, S
·
Krzywinski, J
·
Chalupsky, J
·
Juha, L
·
Cihelka, J
·
Hajkova, V
·
[+3]·
[+1]·
[+10]·
Andreasson, J
·
Wark, JS
·
Riley, D
·
Tschentscher, T
·
Hajdu, J
·
Lee, RW
Document Type
Article
Year published
2009
Published
in OPTICS EXPRESS, ISSN: 1094-4087
Volume: 17, Issue: 20, Pages: 18271-18278 (8)
Indexing
Publication Identifiers
Pubmed: 19907618
SCOPUS: 2-s2.0-70349680899
Wos: WOS:000270295300112
Source Identifiers
ISSN: 1094-4087
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Info
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Name Order Name   Name Order Name   Name Order Name
1 Nelson, AJ;   2 Toleikis, S;   3 Chapman, H;
4 Bajt, S;   5 Krzywinski, J;   6 Chalupsky, J;
7 Juha, L;   8 Cihelka, J;   9 Hajkova, V;
10 Vysin, L;   11 Burian, T;   12 Kozlova, M;
13 Faeustlin, RR;   14 Nagler, B;   15 Vinko, SM;
16 Whitcher, T;   17 Dzelzainis, T;   18 Renner, O;
19 Saksl, K;   20 Khorsand, AR;   21 Heimann, PA;
22 Sobierajski, R;   23 Klinger, D;   24 Jurek, M;
25 Pelka, J;   26 Iwan, B;   27 Andreasson, J;
28 Timneanu, N;   29 Fajardo, M ;   30 Wark, JS;
31 Riley, D;   32 Tschentscher, T;   33 Hajdu, J;
34 Lee, RW;