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Analysis of Short-Circuit Conditions in Logic Circuits
AuthID
P-012-YNB
2
Author(s)
Afonso, J
·
Monteiro, J
Document Type
Proceedings Paper
Year published
2017
Published
in
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017
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DOI
:
10.23919/date.2017.7927102
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