Deep Level Defects in 4H-Sic Epitaxial Layers

AuthID
 P-013-1BA
12
Author(s)
Capan I.
·
Brodar T.
·
Ohshima T.
·
Sato S.I.
·
Makino T.
·
Pastuović Ž.
·
Siegele R.
·
Snoj L.
·
Radulović V.
·
Demmouche K.
Document Type
Proceedings Paper
Year published
2018
Published
in Materials Science Forum, ISSN: 02555476
Volume: 924 MSF, Pages: 225-228 (3)
Indexing
Scopus®
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Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85049017436
Source Identifiers
ISSN: 02555476
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