A Method to Investigate the Electron Scattering Characteristics of Ultrathin Metallic Films by in Situ Electrical Resistance Measurements

AuthID
 P-003-J2H
4
Author(s)
Document Type
Article
Year published
2009
Published
in REVIEW OF SCIENTIFIC INSTRUMENTS, ISSN: 0034-6748
Volume: 80, Issue: 7, Pages: 073909 (5)
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Publication Identifiers
SCOPUS: 2-s2.0-68949122611
Wos: WOS:000268615700032
Source Identifiers
ISSN: 0034-6748
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