Publications

AuthID
P-013-ZE7

Author(s)

Callegari, JMS

Cupertino, AF

Ferreira, VN

Brito, EMS

Pereira, HA

Document Type

Proceedings Paper

Year published

2019

Published

in MICROELECTRONICS RELIABILITY, ISSN: 0026-2714

Volume: 100, Pages: 113439 (7)

Indexing

Wos^®

Crossref^®9

Google Scholar^®

Publication Identifiers

DOI: 10.1016/j.microrel.2019.113439

Wos: WOS:000503907900113

Source Identifiers

ISSN: 0026-2714

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