Publications

AuthID
P-013-ZEZ

Author(s)

Brito, EMS

Cupertino, AF

Pereira, HA

Ladoux, P

Document Type

Article

Year published

2023

Published

in MICROELECTRONICS RELIABILITY, ISSN: 0026-2714

Volume: 148, Pages: 115171 (6)

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Wos^®

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Publication Identifiers

DOI: 10.1016/j.microrel.2023.115171

Wos: WOS:001062935400001

Source Identifiers

ISSN: 0026-2714

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